Used Metrology and inspection equipment
1,143 results【Main Specifications】 ・Controller: IM-6700 ・Measuring head: IM-6225 (wide field of view/variable illumination Location : ASIA (North East)
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More detailsThe Nanospec 210 is a wafer tester that has a film thickness measurement system. It has a 100 angstrom resol Location : AMERICA North (USA-Canada-Mexico)
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More detailsMeasurement Display Range … 200 A to 655,000 A (20nm to 65,000nm) Vertical Resolution … 5A (.5nm) Scan Length Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield Illumination Type Reflected Light Binocular Angle 45° Eyepieces Mo Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Type Microzoom Multiple Objectives Models Bausch and Lomb 2.25 X 0.04 N.A. 8 X 0.15 N.A. 25 X 0.3 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope for machines (without stand) Objective: Nikon G-AL 0,29 x Oculars: 20 x Illumination: up to 29 x o Location : EUROPE (Western and Northern)
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More detailsThis tool includes chem cabinets and Temperature and Humidity module. The controller is programed in DOS. Pump Location : EUROPE (Western and Northern)
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More detailsMicroscope: Measuring Location : ASIA (North East)
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More detailsAnti Static Probes YES Heated Nitrogen YES Rotors Included YES Controller Type Microprocessor Controller T Location : AMERICA North (USA-Canada-Mexico)
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More detailsSubstrate Size Up to 125mm Wafer Size Range Maximum 125 mm Controller Type Microprocessor Controller Ty Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 60° Eyepieces Magnification 10 X Field Number 22 mm Magnification Range 10 X - 40 Location : AMERICA North (USA-Canada-Mexico)
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More details<b> Specification </b> ・Controller: IM-6600 ・Measuring head: IM-6120 ・Photograph element: 6.6 million pixels C Location : ASIA (North East)
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More detailsParmi SPI Tabletop Solder Paste Inspector Model Number: 50T Notes: • Measuring principle: Laser optical trian Location : AMERICA North (USA-Canada-Mexico)
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More detailsMachine Software version: 7.146 Programming software: Valor Vplan(Mentor Graphics) Vplan software version: 12. Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More details<b> specification </b> ・Controller: IM-6500 ・Measuring head: IM-6010 ・Photograph element: 6.6 million pixel mo Location : ASIA (North East)
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More details【specification】 ・Measuring head/controller: VR-3200/VR-3000 ・Observation mode: Wide field of view (12, 25, 38, Location : ASIA (North East)
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More details○Main specifications ・Stage movement: X axis 200mm, Y axis 200mm, θ axis ±5° ・Microscope stage movement: X axi Location : ASIA (North East)
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More detailsMeasurement Display Range … 200 A to 655,000 A (20nm to 65,000nm) Vertical Resolution … 5A (.5nm) Scan Length Location : AMERICA North (USA-Canada-Mexico)
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More detailsInspection/Auto Optical Year(s) : 2014 Location : ASIA (North East)
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More detailsInspection/Auto Optical Year(s) : 2014 Location : ASIA (North East)
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More detailsAligner/Mask Year(s) : 2005, 2007 Location : ASIA (North East)
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More detailsX-Ray Inspection System consisting of: - PC & Monitors - Mouse and Keyboard Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)
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More details(HIGH PRESSURE SCRUBBING) UP TO 8″ DIAMETER WAFERS INFRARED DRYER Location : AMERICA North (USA-Canada-Mexico)
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More detailsDescription OmniMap AutoRS75/tc Wafer Size Range Minimum 150 mm Maximum 200 mm Set Size 200 mm Year(s) : 1996 Location : EUROPE (Western and Northern)
Price : On request
More detailsExterior Dimensions Width 36.220 in (92.0 cm) Depth 33.071 in (84.0 cm) Height 78.740 in (200 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.