Used Semiconductor Equipment

PRODUCTION PATTERN PROBE STATION Location : AMERICA North (USA-Canada-Mexico)

Price : On request

S1000 3″ PROBE STATION Includes B&L Stereo Zoom 4 Optics Location : AMERICA North (USA-Canada-Mexico)

Price : On request

PROBES UP TO 200mm OR 8″ WAFERS. AVAILABLE WITH STEREO ZOOM OPTICS OR HIGH POWER MICROSCOPES (MICROZOOM OR MIT Location : AMERICA North (USA-Canada-Mexico)

Price : On request

【specification】 ・Controller: IM-6700 ・Measuring head: IM-6225T (variable lighting, height unit type) ・Photogra Location : ASIA (North East)

Price : On request

【specification】 Printing laser: Fiber laser class 4 laser Laser wavelength: 1064nm Laser oscillator output: 20 Year(s) : 2019 Location : ASIA (North East)

Price : On request

【specification】 Model: Type: MD-X1020 (wide area specification) Type: XYZ3-axis simultaneous scanning method M Year(s) : 2017 Location : ASIA (North East)

Price : On request

Marantz AOI System Vintage: 2007 Year(s) : 2007 Location : EUROPE (Western and Northern)

Price : On request

MANUAL PROBE STATION PROBE UP TO 5″ WAFERS, FAST CHESSMAN MOVEMENT FOR LARGE GEOMETRIES AND JOYSTICK FOR FINE Location : AMERICA North (USA-Canada-Mexico)

Price : On request

ULTRACISION 860 200mm XY TRAVEL WITH 8″ DIAMETER CHUCK WITH B&L ZOOM 5 STEREO OPTICS (8-40X) OR 16-80X WITH 2 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Binocular Angle 45° Eyepieces Model 455043-0000 Magnification 10 X Field Number 23 mm Trinocular/P Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Microscope Configuration Brightfield Illumination Type Reflected Light Binocular Angle 45° Eyepieces Mo Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Microscope Configuration Brightfield & DIC Illumination Type Xe Reflected Light Eyepieces Model KPL-W Location : AMERICA North (USA-Canada-Mexico)

Price : On request

INS:AOI Year(s) : 2006 Location : ASIA (North East)

Price : On request

Inspection: AOI Year(s) : 2015 Location : ASIA (North East)

Price : On request

Prober Version: 300 mm Vintage: 01.05.2006 De-installed, warehoused. Inspection WITH POWER-UP DEMONSTRATION i Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

WAFER FILM THICKNESS MEASUREMENT SYSTEM Vintage: 01.06.1991 KLA-Tencor Prometrix Film Thickness Probe W/ FT-65 Year(s) : 1991 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

ENDURA IMP Ti/TiN PVD 200 mm SNNF Wide body L/L HP Robots 2 x OD 2 x PCII 2 x IMP TiN 1 x IMP Ti 2 x CTI 96 Year(s) : 2000 Location : EUROPE (Western and Northern)

Price : On request

It can be used for both mask cassettes and wafer cassettes. There are 2 EPROM chips with this indexer. 1st E Location : EUROPE (Western and Northern)

Price : On request

Tool Status: Deinstalled and crated and in storage. (March 2023) Wafer Size 300 mm Process PE-ALD System Softw Year(s) : 2010 Location : EUROPE (Western and Northern)

Price : On request

Microwave plasma batch system Autoload PC Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size: 3,4,5,6 inch capability Gas Lines: 4 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

S4075-11020 Barrel Plasma Asher D380-015 With 4000C controller and PM-112 RF Generator Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Configuration: Supports wafer sizes up to 300mm (330mm Platen) RIE set up for SiO2 Etch RF Gener Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

【Main Specifications】 ・Controller: IM-6700 ・Measuring head: IM-6225 (wide field of view/variable illumination Location : ASIA (North East)

Price : On request

The Nanospec 210 is a wafer tester that has a film thickness measurement system. It has a 100 angstrom resol Location : AMERICA North (USA-Canada-Mexico)

Price : On request