Used Metrology and inspection equipment
1,042 resultsModel NSR-2205EX14C 200mm Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details200mm Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details【specification】 Observation method Epi-illumination: bright field, dark field, differential interference obse Location : ASIA (North East)
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More detailsBrand Mitaka Kohki Non-contact 3D measuring device 【Main Specifications】 〇Microscope section ・Expensive obser Location : ASIA (North East)
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More detailsFeatures: One-touch changeover switch for coarse and fine movement of the large stage Excellent image Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 45° Eyepieces Magnification 10 X Magnification Range 8 X - 28 X Zoom Range 0.8 X - Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 45° Eyepieces Model 10x/21 Magnification 10 X Field Number 21 mm Magnification Ran Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 60° Eyepieces Magnification 10 X Field Number 23 mm Magnification Range 9 X - 40 X Location : AMERICA North (USA-Canada-Mexico)
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More detailsSUSS MJB3 MASK ALIGNER consisting of: - Model: MJB3 Main System - Configured for Top Side Alignment - Max Waf Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA-TENCOR ALPHA-STEP IQ PROFILER consisting of: - Model: Alpha-Step IQ - Up to 6”/150mm Wafer Capable - Scan Location : AMERICA North (USA-Canada-Mexico)
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More detailsOAI MBA 806 Mask Aligner OAI MBA 806 Mask Aligner consisting of: - Model: MBA806 - Manual Wafer Load Mask Alig Location : AMERICA North (USA-Canada-Mexico)
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More detailsMinimum Temperature -25 ºC (-13 ºF, 248.00 ºK) Maximum Temperature 150 ºC (302 ºF, 423 ºK) Cooling Capac Location : AMERICA North (USA-Canada-Mexico)
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More detailsMinimum Temperature -25 ºC (-13 ºF, 248.00 ºK) Maximum Temperature 150 ºC (302 ºF, 423 ºK) Cooling Capac Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope Configuration Brightfield & Darkfield Illumination Type Reflected Light Binocular Angle 45° Eye Location : AMERICA North (USA-Canada-Mexico)
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More details【specification】 Monitor Color LCD TFT 15 inch 3D display function available Photographing element (CCD) 1/1.8 Location : ASIA (North East)
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More detailsComet sorter/150-200mm Location : ASIA (North East)
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More details150mm PROBE STATION (AVAILABLE WITH 6″ HOT CHUCK) INCLUDES B&L STEREO ZOOM 7 OPTICS, OR CAN BE UPGRADED TO MIC Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsS250 ANALYTICAL 4″ STATION WITH B&L MICROZOOM Location : AMERICA North (USA-Canada-Mexico)
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More detailsREL 6″ PROBE STATION WITH 6″ CHUCK AND 6X6″ TRAVEL FIXED PLATEN, Z MOVEMENT CONTROLLED BY CHUCK B&L STEREO ZOO Location : AMERICA North (USA-Canada-Mexico)
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More details9000 SUMMIT PROBE STATION 6X6″ Chuck, 6×6″ Travel Trinocular microscope zooms from 7-45x with 10x e.p. with ne Location : AMERICA North (USA-Canada-Mexico)
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More detailsPS21 Automatic 8″ Prober with Microchamber Includes: 2 RF xyz probes, video camera and 200mm Hot chuck. Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- Wafer Size: Small Pieces up to 6”/150mm Diameter Wafers - Topside (TSA) Alignment - Suss Splitfield Microsco Location : AMERICA North (USA-Canada-Mexico)
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More details- 3 open cassette load stations - 5 anneal chambers - 3 Electrofill Cells (Plating Cells) - 3 Post Electrofill Location : AMERICA North (USA-Canada-Mexico)
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More detailsExterior Dimensions Width 15.750 in (40.0 cm) Depth 13.750 in (34.9 cm) Height 17.000 in (43. Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-Tencor SP2 ( S/N S1204-XXX, 300mm X 2 Load Port, Vintage 2004, Edge Handling ) AS IS WHERE IS · MFG Date; Year(s) : 2004 Location : ASIA (North East)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.