F20 Advanced Thin Film Measurement System
Ref :
2627470-9-W
Condition :
Used
Manufacturer :
-
Model :
F20
Short Description :
Advanced Thin Film Measurement System
Year(s) :
-
Quantity :
1
Location :
Seller or machines location:
AMERICA North (USA-Canada-Mexico)
AMERICA North (USA-Canada-Mexico)
Brand Filmetrics
Thickness, refractive index and extinction coefficient
are measured quickly and easily with
the F20 advanced spectrometry system.
Spectral analysis of reflections from the top and
bottom of the thin-film provides thickness and
optical constants (n and k) in seconds.
Measurement Range:
Thickness 100Å to 50 µm
Optical Constants 1000Å to 10 µm
Thickness Accuracy: +/- 1 nm at 500 nm thickness.
Precision: 0.1 nm.
Repeatability: 0.07 nm. 110V, 50/60Hz
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