Used Metrology and inspection equipment
1,066 resultsDescription OmniMap AutoRS75/tc Wafer Size Range Minimum 150 mm Maximum 200 mm Set Size 200 mm Year(s) : 1996 Location : EUROPE (Western and Northern)
Price : On request
More details【specification】 Monitor Color LCD (IPS type) 23-inch 3D display function available Photographing device (CCD) Location : ASIA (North East)
Price : On request
More details【specification】 Type Measurement objective lens Minimum measurement display 0.1μm/0.5μm/1μm (switchable) Meas Location : ASIA (North East)
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More details【specification】 ・Secondary electron image resolution: 3.0nm (acceleration voltage 30kV, high vacuum mode) 10n Location : ASIA (North East)
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More detailsDisk Inspection Microscope/Motorized Stage Microscope Type Upright Microscope Configuration Brightfield, DIC Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield & Darkfield Illumination Type Reflected Light Binocular Angle Variable Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield, Darkfield & DIC Illumination Type Hg Reflected Light Binocular Angle Location : AMERICA North (USA-Canada-Mexico)
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More detailsIon implanter Model E220 Year(s) : 1995 Location : ASIA (North East)
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More detailsLithography Coater and Developer Version: 300 mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsMetal film measurement system Version: 150-200 mm Vintage: 01.06.2006 The equipment has been professionally de Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpectroscopic ellipsometry: Measures the change in polarization state of light reflected from a sample to de Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe Model DE3496 provides particle concentrations per in.2 or cm2 in five sizes from 0.3 µm to 10 µm. It mea Location : AMERICA North (USA-Canada-Mexico)
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More detailsBare Wafer Surface Defect Inspection System Max Wafer Capable: 8”/200mm System configured for 8“/200mm wafers Location : AMERICA North (USA-Canada-Mexico)
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More detailsDigital Microscope Model Number: VHX-5000 • Controller Unit: VHX-5000 • Camera Unit: VHX-5020 • RZ Lens: VH-Z2 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBare Wafer Surface Defect Inspection System The Surfscan 6400 is a highly advanced inspection system desig Location : AMERICA North (USA-Canada-Mexico)
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More detailsSurface Inspection System Location : AMERICA North (USA-Canada-Mexico)
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More detailsUnpatterned Surface Inspection System Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield, Darkfield & DIC Illumination Type Reflected Light Binocular Angle 45° Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield Illumination Type Reflected & Transmitted Light Binocular Angle 45° Ey Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield & Darkfield Illumination Type Hg Reflected Light Binocular Angle 45° T Location : AMERICA North (USA-Canada-Mexico)
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More detailsCapable of 2" - 8" wafers Low angle optics Non-Patterned surface Inspection System 0.10 micron Defect Sensitiv Location : AMERICA North (USA-Canada-Mexico)
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More detailsIn addition to its advanced data analysis software, the ADE 7200 offers a user-friendly interface that makes Location : AMERICA North (USA-Canada-Mexico)
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More detailsOur Particle Deposition System SST-1500is the only tool in the semiconductor industry that produces the high Location : AMERICA North (USA-Canada-Mexico)
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More detailsExterior Dimensions Width 36.220 in (92.0 cm) Depth 33.071 in (84.0 cm) Height 78.740 in (200 Location : EUROPE (Western and Northern)
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More detailsKLA-Tencor - Tool in production - Measures Film Thickness, Refractive Index (RI) and Extinction Coefficient o Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.