Used Metrology and inspection equipment
1,136 resultsMicroscope: Measuring Location : ASIA (North East)
Price : On request
More detailsAnti Static Probes YES Heated Nitrogen YES Rotors Included YES Controller Type Microprocessor Controller T Location : AMERICA North (USA-Canada-Mexico)
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More detailsSubstrate Size Up to 125mm Wafer Size Range Maximum 125 mm Controller Type Microprocessor Controller Ty Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 60° Eyepieces Magnification 10 X Field Number 22 mm Magnification Range 10 X - 40 Location : AMERICA North (USA-Canada-Mexico)
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More details<b> Specification </b> ・Controller: IM-6600 ・Measuring head: IM-6120 ・Photograph element: 6.6 million pixels C Location : ASIA (North East)
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More detailsParmi SPI Tabletop Solder Paste Inspector Model Number: 50T Notes: • Measuring principle: Laser optical trian Location : AMERICA North (USA-Canada-Mexico)
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More detailsMachine Software version: 7.146 Programming software: Valor Vplan(Mentor Graphics) Vplan software version: 12. Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More details<b> specification </b> ・Controller: IM-6500 ・Measuring head: IM-6010 ・Photograph element: 6.6 million pixel mo Location : ASIA (North East)
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More details【specification】 ・Measuring head/controller: VR-3200/VR-3000 ・Observation mode: Wide field of view (12, 25, 38, Location : ASIA (North East)
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More details○Main specifications ・Stage movement: X axis 200mm, Y axis 200mm, θ axis ±5° ・Microscope stage movement: X axi Location : ASIA (North East)
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More detailsMeasurement Display Range … 200 A to 655,000 A (20nm to 65,000nm) Vertical Resolution … 5A (.5nm) Scan Length Location : AMERICA North (USA-Canada-Mexico)
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More detailsInspection/Auto Optical Year(s) : 2014 Location : ASIA (North East)
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More detailsInspection/Auto Optical Year(s) : 2014 Location : ASIA (North East)
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More detailsAligner/Mask Year(s) : 2005, 2007 Location : ASIA (North East)
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More detailsX-Ray Inspection System consisting of: - PC & Monitors - Mouse and Keyboard Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)
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More details(HIGH PRESSURE SCRUBBING) UP TO 8″ DIAMETER WAFERS INFRARED DRYER Location : AMERICA North (USA-Canada-Mexico)
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More detailsDescription OmniMap AutoRS75/tc Wafer Size Range Minimum 150 mm Maximum 200 mm Set Size 200 mm Year(s) : 1996 Location : EUROPE (Western and Northern)
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More detailsExterior Dimensions Width 36.220 in (92.0 cm) Depth 33.071 in (84.0 cm) Height 78.740 in (200 Location : EUROPE (Western and Northern)
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More detailscomplete last time in production: 27.07.2023 CM Sorter 8"TWS150/200 technical data: Maße Höhe 2450/B1750/T16 Year(s) : 2008 Location : EUROPE (Western and Northern)
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More detailsWafer Size Range Minimum 300 mm Maximum 300 mm Set Size 300 mm Accessories We sell the tool with Year(s) : 2014 Location : EUROPE (Western and Northern)
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More detailsMeasures Film Thickness, Refractive Index (RI) and Extinction Coefficient of Single and Multi-Layer Thin Film Year(s) : 2000 Location : EUROPE (Western and Northern)
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More detailsExterior Dimensions Width 47.244 in (120.0 cm) Depth 58.268 in (148.0 cm) Height 66.929 in (1 Year(s) : 2015 Location : EUROPE (Western and Northern)
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More detailsLaser Cutting System Wafer Size Range Minimum 100 mm Maximum 150 mm Accessories Cutting Table Safet Year(s) : 1994 Location : EUROPE (Western and Northern)
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More detailsComplete Nikon microscope-system CE Marked YES Year of Manufacture 2010 Condition Excellent Year(s) : 2010 Location : EUROPE (Western and Northern)
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More detailsWafer Size Range Minimum 125 mm Maximum 200 mm Controller Type PC Controller Type Cassette to Cassett Year(s) : 1998 Location : EUROPE (Western and Northern)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.