Used Metrology and inspection equipment
1,041 results【specification】 Monitor Color LCD TFT 15 inch 3D display function available Photographing element (CCD) 1/1.8 Location : ASIA (North East)
Price : On request
More detailsComet sorter/150-200mm Location : ASIA (North East)
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More details150mm PROBE STATION (AVAILABLE WITH 6″ HOT CHUCK) INCLUDES B&L STEREO ZOOM 7 OPTICS, OR CAN BE UPGRADED TO MIC Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsS250 ANALYTICAL 4″ STATION WITH B&L MICROZOOM Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsREL 6″ PROBE STATION WITH 6″ CHUCK AND 6X6″ TRAVEL FIXED PLATEN, Z MOVEMENT CONTROLLED BY CHUCK B&L STEREO ZOO Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details9000 SUMMIT PROBE STATION 6X6″ Chuck, 6×6″ Travel Trinocular microscope zooms from 7-45x with 10x e.p. with ne Location : AMERICA North (USA-Canada-Mexico)
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More detailsPS21 Automatic 8″ Prober with Microchamber Includes: 2 RF xyz probes, video camera and 200mm Hot chuck. Location : AMERICA North (USA-Canada-Mexico)
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More details- Wafer Size: Small Pieces up to 6”/150mm Diameter Wafers - Topside (TSA) Alignment - Suss Splitfield Microsco Location : AMERICA North (USA-Canada-Mexico)
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More details- 3 open cassette load stations - 5 anneal chambers - 3 Electrofill Cells (Plating Cells) - 3 Post Electrofill Location : AMERICA North (USA-Canada-Mexico)
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More detailsExterior Dimensions Width 15.750 in (40.0 cm) Depth 13.750 in (34.9 cm) Height 17.000 in (43. Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA-Tencor SP2 ( S/N S1204-XXX, 300mm X 2 Load Port, Vintage 2004, Edge Handling ) AS IS WHERE IS · MFG Date; Year(s) : 2004 Location : ASIA (North East)
Price : On request
More detailsOptima MD, 300mm, s/n: 083015 Medium Current Implant Tool ID: IMP205 Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsNSR-2205EX14C, 200mm, S/N 7573113 Tool ID: SDUV-505 Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
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More detailsACT8, 200mm, S/N 9101151 Tool ID: UVCD-505 Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsModel U-SWH 10x.26.5 Magnification 10 X Field Number 26 mm Focusing YES Trinocular/Phototube Provide Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details5 head driller, T188 spindle, manual load, prism&slot clamp, mushroom clamps Year(s) : 2004 Location : EUROPE (Western and Northern)
Price : On request
More detailsCMP(with scrubber) Year(s) : 2004 Location : ASIA (North East)
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More detailsFoup purge station Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsEpitaxy process Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)
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More detailsG3 Lite, 300mm, S/N W3041 Tool ID: YSEM732 Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFeatures: -Tube Voltage: 160kV Tube type: Transmissive (open) - Oblique views: Up to 70 degree oblique angl Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details-AXIS Active Image Stabilisation -XiDAT 2.0 imaging chain -Up to 70 degree oblique angle views over the entire Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSW : Inxpectex XT 3.1.8 Reconstruction (CT SW) : VG Studio MAX 2.2 Tube: 160KV 20W Nanotech TT De Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSerial No. 3384 160 Kv Multi-Focus x-ray Tube / Open Tube 10W Max Target Power 70 degree angular view ADR-Aut Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSurface charge measurement 300mm Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.