Sonix Quantum 350

SONIX Quantum 350 Scanning Acoustic Microscopy (SAM)

Wafer Size 8"
Scanning Acoustic Tomography (SAT), also called Scanning Acoustic Microscope (SAM), is a method for analyzing materials by measuring the reflecting speed and energy of an ultrasonic wave which is transmitted through the material of a certain thickness.

Testing modes:
A-scan (ultrasonic signal).
B-scan (2D reflective cross-section detection/ imaging).
C-scan (2D reflective plane detection/ imaging).
Through-scan (pass-through detection/ imaging).

Applications / Features:
Normally used to detect delaminations or cracks inside the package, SAT is capable of detecting micro gaps down to 0.13μm.
IC package level structure analysis
IC package quality on PCBA level
PCB/IC substrate structure analysis
Wafer level structure analysis
WLCSP structure analysis
CMOS structure analysis

Imaging resolution : 0.5 micron
Scan speed : Max. 1000 mm/s
Scan area : 350 mm x 350 mm