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Metrology and inspection equipment

901 items found (Save this search)
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1840536_f5a70264ce64108171f27eb5a510eb94 KLA-Tencor P-22 (P22) Profiler ID#: 4382 - Model: P-22 (P22) - Automate...
08 Mar. 2018

AMERICA North (USA-Canada-Mexico) See details
1840474_ffb2e4c68f46d77bbc96e1e1a4e1af34 KLA-Tencor Surfscan 6220 ID#: 4362 - Model: Surfscan 6220 - Automatic S...
08 Mar. 2018

AMERICA North (USA-Canada-Mexico) See details
1840451_aac1436f599e2fd73a18bfe6109800ac Nanometrics 6100 ID#: 4378 - Model: Nanospec 6100 - Capable of accommod...
08 Mar. 2018

AMERICA North (USA-Canada-Mexico) See details
1840369_9bf6352ca68033dcbc32353e4b2d238d KLA-Tencor 5100 Overlay Registration System ID#: XT1083 - Model: 5100 Ov...
08 Mar. 2018

AMERICA North (USA-Canada-Mexico) See details
1830244_81a5d8595078a95e8bf246f8bc834a88 ZEISS Supra 40 Field emission scanning electron microscope (FESEM) With EDS...
19 Feb. 2018

AMERICA North (USA-Canada-Mexico) See details
1826461_49439bc801acc902bb038af3e2744f4a Manufacturer: JEOL Model: JEM 2010 Transmission electron microscope (TEM) ...
12 Feb. 2018

1994 AMERICA North (USA-Canada-Mexico) See details
1796784_a4a6990b7ae79361c9da796d6f81c297 Nikon i12D i-Line Stepper Currently powered on for an inspection. It is in wo...
05 Mar. 2018

2000 AMERICA North (USA-Canada-Mexico) See details
1744188_a06a897a5d28084a4d5b789ab8470e0f 1x KLA-Tencor, Surfscan 6220, Inspection System Description - Automat...
13 Oct. 2017

AMERICA North (USA-Canada-Mexico) See details
1736590_77358897a959dfe83c03c091e0d30d1d 1 x JEOL Model: JWS 7505 Scanning electron microscope (SEM) Pumps included.
18 Aug. 2017

AMERICA North (USA-Canada-Mexico) See details
1717786_bc814d1e859045b56951391dc5add98d 1x KLA-Tencor, Surfscan 6000 Series, Inspection System Description ...
07 Jul. 2017

AMERICA North (USA-Canada-Mexico) See details
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No_picture_85_85 1x Applied Materials (AMAT), SemVision CX, Metrology & Inspection, 1999 ...
21 Jun. 2017

AMERICA North (USA-Canada-Mexico) See details
1705989_7a2992b9c4fbb65eb65247aa67e1da19 1 x JEOL JWS 7550 Scanning Electron Microscope (SEM), 8", 1999 EDX d...
05 Jun. 2017

1999 AMERICA North (USA-Canada-Mexico) See details
1687628_8171ebcd03a021bc8d0d7d77ab340edc 1 x SEMIPROBE Model: SA-8 Wafer Size: 8" Semiautomatic prober, 8". ...
20 Apr. 2017

AMERICA North (USA-Canada-Mexico) See details
1659813_d0266f6eebda5e693d7c25b03a05e846 1x KLA-Tencor ASET F5x, THIN FILM MEASUREMENT SYSTEM Description -...
21 Feb. 2017

AMERICA North (USA-Canada-Mexico) See details
1565759_fccffc0ab0db7fafb31271962348b8d3 1x, KLA-Tencor Prometrix RS50 Four Point Probe Resistivity Mapping System<...
02 Sep. 2016

AMERICA North (USA-Canada-Mexico) See details
1565758_2dc33eb5930d344a740aa42fd993d262 1x, KLA-Tencor, Prometrix RS55/tc Four Point Probe Resistivity Mapping Sys...
02 Sep. 2016

AMERICA North (USA-Canada-Mexico) See details
1565754_a7cdbf1bc7a65b9ea32eb27be9486f02 1x, KLA-Tencor, Prometrix RS55/tc Four Point Probe Resistivity Mapping Sys...
05 Oct. 2017

AMERICA North (USA-Canada-Mexico) See details
No_picture_85_85 1x, KLA-Tencor, Surfscan 4000 Wafer Inspection System - Can handle...
02 Sep. 2016

AMERICA North (USA-Canada-Mexico) See details
No_picture_85_85 1x, KLA-Tencor, 2138XP Surface Inspection System - Currently Setup...
02 Sep. 2016

AMERICA North (USA-Canada-Mexico) See details
1444968_94d7fa3a6d01849e84f66cff2b33e5df Brand: KLA-Tencor Model: SURFSCAN 4500 INSPECTION SYSTEM Used Details:Ca...
02 Jun. 2016

AMERICA North (USA-Canada-Mexico) See details
901 items found. Results 1 to 20
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