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Metrology and inspection equipment

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1761809_b6d1b442e8400a1417369a095771716f - Automatic Surface Inspection System - Bare Wafer Surface Defect Inspection...
10 Oct. 2017

AMERICA North (USA-Canada-Mexico) See details
No_picture_85_85 - Four Point Probe System - Up to 200 mm wafers - Provides throughput of o...
07 Oct. 2017

AMERICA North (USA-Canada-Mexico) See details
1744188_a06a897a5d28084a4d5b789ab8470e0f 1x KLA-Tencor, Surfscan 6220, Inspection System Description - Automat...
13 Oct. 2017

AMERICA North (USA-Canada-Mexico) See details
1736590_77358897a959dfe83c03c091e0d30d1d 1 x JEOL Model: JWS 7505 Scanning electron microscope (SEM) Pumps included.
18 Aug. 2017

AMERICA North (USA-Canada-Mexico) See details
1717786_bc814d1e859045b56951391dc5add98d 1x KLA-Tencor, Surfscan 6000 Series, Inspection System Description ...
07 Jul. 2017

AMERICA North (USA-Canada-Mexico) See details
No_picture_85_85 1x Applied Materials (AMAT), SemVision CX, Metrology & Inspection, 1999 ...
21 Jun. 2017

AMERICA North (USA-Canada-Mexico) See details
1705989_7a2992b9c4fbb65eb65247aa67e1da19 1 x JEOL JWS 7550 Scanning Electron Microscope (SEM), 8", 1999 EDX d...
05 Jun. 2017

1999 AMERICA North (USA-Canada-Mexico) See details
No_picture_85_85 1 x SEIKO SMI 3200 Single focused ion beam (FIB) system, 8", 2006 Sc...
03 May. 2017

2006 AMERICA North (USA-Canada-Mexico) See details
1687628_8171ebcd03a021bc8d0d7d77ab340edc 1 x SEMIPROBE Model: SA-8 Wafer Size: 8" Semiautomatic prober, 8". ...
20 Apr. 2017

AMERICA North (USA-Canada-Mexico) See details
1659813_d0266f6eebda5e693d7c25b03a05e846 1x KLA-Tencor ASET F5x, THIN FILM MEASUREMENT SYSTEM Description -...
21 Feb. 2017

AMERICA North (USA-Canada-Mexico) See details
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1657257_a335cae2a841194ae03564fab92ff22a 1 x JEOL Model: JSM 6700F, 2000 Field emission scanning electron mic...
14 Feb. 2017

2000 AMERICA North (USA-Canada-Mexico) See details
1657251_ab9904b32271251b3a58c13164d5addd 1 x JEOL Model: JSM 6401F Equipment Details: Field emission scanni...
14 Feb. 2017

AMERICA North (USA-Canada-Mexico) See details
1641938_7e220f94683cc07c65dc794d864b091f 1 x HITACHI RS-4000 Scanning electron microscope (SEM), 8"-12", 2005 ...
16 Jan. 2017

2005 AMERICA North (USA-Canada-Mexico) See details
1565759_fccffc0ab0db7fafb31271962348b8d3 1x, KLA-Tencor Prometrix RS50 Four Point Probe Resistivity Mapping System<...
02 Sep. 2016

AMERICA North (USA-Canada-Mexico) See details
1565758_2dc33eb5930d344a740aa42fd993d262 1x, KLA-Tencor, Prometrix RS55/tc Four Point Probe Resistivity Mapping Sys...
02 Sep. 2016

AMERICA North (USA-Canada-Mexico) See details
1565754_a7cdbf1bc7a65b9ea32eb27be9486f02 1x, KLA-Tencor, Prometrix RS55/tc Four Point Probe Resistivity Mapping Sys...
05 Oct. 2017

AMERICA North (USA-Canada-Mexico) See details
No_picture_85_85 1x, KLA-Tencor, Surfscan 4000 Wafer Inspection System - Can handle...
02 Sep. 2016

AMERICA North (USA-Canada-Mexico) See details
No_picture_85_85 1x, KLA-Tencor, 2138XP Surface Inspection System - Currently Setup...
02 Sep. 2016

AMERICA North (USA-Canada-Mexico) See details
1444968_94d7fa3a6d01849e84f66cff2b33e5df Brand: KLA-Tencor Model: SURFSCAN 4500 INSPECTION SYSTEM Used Details:Ca...
02 Jun. 2016

AMERICA North (USA-Canada-Mexico) See details
1444967_5e0a3e8f44b2d2851e9031c4877654d8 Brand: KLA-Tencor Model: UV-1280SE THIN FILM MEASUREMENT SYSTEM Used De...
02 Jun. 2016

AMERICA North (USA-Canada-Mexico) See details
743 items found. Results 1 to 20
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