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Hitachi

Ref : 1885664-9
Condition : Used
Manufacturer : Hitachi
Model : -
Year(s) : -
Quantity : 0
Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)
Last check : 28 Sep. 2018

Hitachi S-8820 Metrology

Description:
Hitachi S8820 CD-SEM,SEM Magnification 1,000x to 150,000x,Wafer imaging ability: Entire surface of 8” wafer, Depth of focus: >= 1.0mm at 80,000x magnification,Resolution:5 nm at 800V on CRT,Optical Microscope: Monochrome CCD camera, Fixed Mag of 110x, Workstation, HP 715-64 computer or later model,Multipoint Measurement Function,Edge Roughness Function,Contact Hole Measurement Function,Automated Image Archiving Function,Leybold 50 turbo on loadlock, Leybold 340 turbo on main chamber,Operating Voltage 100 V AC, 50 Amp