InspecTech KIS 2000

Brand: InspecTech
Model: KIS 2000
Inspection System

Used
Details:
An automatic inspection tool
that inspects both sides of diced wafers
for any chipping or cracking
It also monitors kerf chipping sizes, kerf width, misalignment, as well as the proximity of damages to the edges

Features:
Compatible with wafers up to 300mm in diamater
PC Pentium MMX 2000 MHz
Windows NT operation system
Matrox PCI frame grabber
Z stage - 25mm/0.1µm accuracy
2.5x to 10x microscope
Black and white CCD high resolution camera
Automatic wafer loading (optional)
Wafer inking (optional)
Maximizes yield
Stores defect information