Used Metrology and inspection equipment
1,035 resultsFeatures: -Tube Voltage: 160kV Tube type: Transmissive (open) - Oblique views: Up to 70 degree oblique angl... Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details-AXIS Active Image Stabilisation -XiDAT 2.0 imaging chain -Up to 70 degree oblique angle views over the entire... Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSW : Inxpectex XT 3.1.8 Reconstruction (CT SW) : VG Studio MAX 2.2 Tube: 160KV 20W Nanotech TT De... Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSerial No. 3384 160 Kv Multi-Focus x-ray Tube / Open Tube 10W Max Target Power 70 degree angular view ADR-Aut... Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSurface charge measurement 300mm Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMax KV : 90KVa Vintage : August 2015 Operating system ; windows 7 Oblique viewing Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsVintage 9/2013 Vintage Tube: 25-160Kv Max tube power: 64W Max target power: 10W High Focus tube with 2 set... Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDetails: Windows 7 Operating System Max PCB: 508mm x 508mm (1) Orthogonal Camera (FOV 40mm x 40mm... Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsTop down Camera: 15MP CoaXPress: 15mp @ 15um/pixel Side viewer Camera system: (4) 10 MP Digial Color Side Angl... Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)
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More details2D Inspection Max Board: 12"x18" Board Thickness: 1mm to 5mm Component Height: 3.0 mm (Top & Bottom) Left to R... Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More details- Still installed in the cleanroom - The tool is connected in-line with a Nikon S204B scanner - The direction... Location : AMERICA North (USA-Canada-Mexico)
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More detailsVertical Furnace, Fast Thermal Oxidation process Version: 200 mm Vintage: 01.06.2001 CONTROLLER TYPE TS4000Z... Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomatic Prober Version: 300 mm Vintage: 01.06.2005 Inspection of these probers is welcomed by appointment.... Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomated Defect Inspection Version: 150 mm/200 mm Automatic Shut down in Fab. Needs to be removed in the ne... Location : AMERICA North (USA-Canada-Mexico)
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More detailsFilm thickness measurement Version: 200 mm Vintage: 01.06.2008 De-installed, warehoused. Can be inspected by... Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel 340 Atomic Force Microscope Version: 300 MM Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAtomic Force Microscope (AFM) Version: 200mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsProber Version: 300 mm Vintage: 01.05.2006 Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
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More details3D Bump Height (Veeco) Version: 150 mm/200 mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope inspection station Version: 200 mm Year(s) : 1995 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTM-330 Version: 150 mm/200 mm Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrightfield Wafer Defect Inspection System Version: 200 mm Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTurboDISC mocvd SYSTEM Version: Inquire Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsRTP Version: 300 mm Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsEquipment crated and stored in warehouse. Resolution ≦ 38 nm NA 1.35 Reduction ratio 1:4 Maximum exposure fiel... Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.