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Nanometrics 4000, Film Thickness Measurement System

Ref : 3215
Condition : Used
Manufacturer : Nanometrics
Model : 4000, Film Thickness Measurement System
Year(s) : 1994
Quantity : 1
Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)
Last check : 09 Aug. 2018

Manufacture: Nanometrics
Model#: 4000

Description:
Film Thickness Measurement System

Spesifications:
Model Number 7200-1821 Rev B.
150 mm Wafer Configuration.