Nanometrics Nanoline Critical

Ref : 2078265-9-W

Condition : Used

Manufacturer : Nanometrics

Model : Nanoline Critical

Year(s) : -

Quantity : 1

Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)

Last check : 24 Apr. 2020

Specifications:
• For Etching and lithography process control
• Highly stable scanning micro densitometer designed, with sub-micron CD metrology capability
• System measures lines, spaces and contact holes
• Applications include: semiconductor wafer, photomasks, magnetic heads and memory disks
• Capability 3" to 6" Wafers

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