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Nanometrics

Ref : 1885531-9
Condition : Used
Manufacturer : Nanometrics
Model : -
Year(s) : -
Quantity : 0
Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)
Last check : 28 Sep. 2018

Nanometrics 210 Metrology

Description:
Thin film thickness measurement system for transparent films on 75mm to 150mm wafers, measures 14 standard film types including photoresists, polyimides, polysilicon, oxides, and nitrides in ranges from 100A to 500kA. Typical measurement time 2.5 seconds.