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Nanometrics

Ref : 1885557-9
Condition : Used
Manufacturer : Nanometrics
Model : -
Year(s) : -
Quantity : 0
Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)
Last check : 28 Sep. 2018

Nanometrics 8000 XSE Metrology

Description:
Cassette to Cassette Thin Film measurement system w/Ellipsometer 8" wafer stage, Operating system - IBM OS,J.A. Woolham M44 Ellipsometer, LPS-300 75W light source, EC 270, 5-8" pre-aligner 115V, 5 amp, 30/60Hz
Equipment Name: 800x-0997-0092 Configuration: 8" wafer
Year: 1998