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Nanometrics

Ref : 1885607-9
Condition : Used
Manufacturer : Nanometrics
Model : -
Year(s) : -
Quantity : 0
Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)
Last check : 28 Sep. 2018

Nanometrics 8000x Metrology

Description:
Cassette to Cassette Thin Film measurement system 8" wafer stage, Operating system - IBM OS 75W light source, In line objectives (E10/.25,40/.55,4/.1,15/.28) ellipsometer is an option,115V, 5 amp, 30/60Hz
Year: 1997