Used Inspection equipment
85 resultsApplication : 10 inch X-Y Stage - Eye pieces : X10 - 2EA - Objective : X2.5, X10, X20, X50, X100, X150 - Pol Location : ASIA (North East)
Price : On request
More detailsMicroscope - Leica High Power Set Application : Visual Inspection(CD, OD, Pitch...) ▲ Eye pieces : X10 ▲ Len Location : ASIA (North East)
Price : On request
More detailsApplication : IR Filter Glass Inspection Location : ASIA (North East)
Price : On request
More detailsUltraport5 Handler Location : EUROPE (Western and Northern)
Price : On request
More details<b>1x, KLA-Tencor 7700 Wafer Inspection System</b> Patterned / Unpatterned wafer inspection system. Specific Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsInspection Microscope in Optical Microscopes, Scanning Electron Microscopes LEITZ ERGOLUX Microscope - Leitz 6 Location : EUROPE (Western and Northern)
Price : On request
More detailsInspection Microscope in Optical Microscopes, Scanning Electron Microscopes LEITZ ERGOLUX AMC Microscope - X/ Location : EUROPE (Western and Northern)
Price : On request
More detailsMicro-Macro Inspection System for large Substrates in Optical Microscopes, Scanning Electron Microscopes This Location : EUROPE (Western and Northern)
Price : On request
More details<b>Brand: Vi Technology</b> <b>Model: 3D SPI In-line</b> <b>Year: 04/2008</b> <u><b>Solder Paste Inspection (A Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsType: Reject Inspection Conveyor Serial : 2011-0728A02 Weight: 176lbs Length: 1000mm Min width: 50mm Max widt Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Inspection equipment on Wotol
The main manufacturers of Inspection equipment are CyberOptics, KLA-Tencor, Saki, Agilent Technologies, Koh Young, Leica, Leitz, Nikon, Vi Technology, Crown, DS Semicon Co, Hitachi, MVP, NuTek, CyberOptics, Olympus, Photon Dynamics, Rudolph, Spea, YESTech.
The main model CG4000, HSSeries, 8160, IOI-6000 (SV6000), Cybersentry 2000, Ultra 1820, 4040 FLYING, REICHERT Polylite88, INM 20, Co DS-VIS, NSX-105c, SJ50 II XL, 5DX II, Flex Ultra HR, Vi3K, SE300 Ultra, VSS-3C, KY8020T, PA-500SB11, BF942, PA500SB11, S8030 Inline, V850L, LI-2000 , BF , MD-2000 , SE300 , BF942 , 7700 , SP1-TBI , ERGULUXSeries, MHL-525MS, KY8030-L, YTV-F1S, Surfscan 5000, NuTek NTM0501RCM-1000.
HS code 9031 41 00 For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices