Used Metrology and inspection equipment
1,153 resultsVoltage: 110 VAC Operating system: Windows Pro SP3 2009 Vintage Complete and in working condition Year(s) : 2009 Location : EUROPE (Western and Northern)
Price : On request
More detailsAuto type Location : ASIA (North East)
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More detailsRS 75 table type is still available, the condition is new/unused and in working condition Location : ASIA (North East)
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More detailsBruker’s DektakXT™ Stylus Profiler features a revolutionary design that enables 4 angstrom repeatability. Unm Location : AMERICA North (USA-Canada-Mexico)
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More detailsAligner:Mask/4in Year(s) : 1979 Location : ASIA (North East)
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More detailsThe Electroglas 2001 wafer probers are extremely accurate, modularly designed automatic wafer probers, configu Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Prober The item is only for end users. It is subject to prior sales without notice. Appreciate your tim Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)
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More details– Operating System: Win 2000 – Probe Card Holder: Rectangular – Power Supply: 110VAC – EGCMD 9.2.1 SP5 – Chuck Location : AMERICA North (USA-Canada-Mexico)
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More detailsFilm Thickness Measurement System Configuration 200 MM Wafer Configuration Year(s) : 1998 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSEM/Scanning Electron Microscope Year(s) : 2016 Location : ASIA (North East)
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More detailsSEM/FE-SEM Location : ASIA (North East)
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More detailsInsp: YAG Welding Alignment System Location : ASIA (North East)
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More detailsEVG 620 MASK ALIGNER consisting of: - Model: EVG620 (Upgraded from a 420) - Manual Mask Aligner - Topside Ali Location : AMERICA North (USA-Canada-Mexico)
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More detailsInspection: Surface Defect/4-6in Year(s) : 2017 Location : ASIA (North East)
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More details17"x19" Work Area 208v 1Phase 50/60Hz Maximum Board Size: 18” x 22” (458mm x 560mm) Minimum Component Size: 0. Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More details160 kV 20 W Nanotech source, feature recognition 500 nm. 5 axis manipulator, max supported weight 5 kg. Max sa Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More details<b> Specification </b> Total magnification 15-94.5× Depression angle 20° Zoom 1-6.3× Working distance approx Location : ASIA (North East)
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More detailsWafer Size: 200mm Desktop Mercury Probe CV Mapper CV92A Embedded computer and a PC Up to 200 mm - 8 inch capab Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe ASET-F5x thin film metrology system can measure materials across a continuous wavelength spectrum from 1 Location : AMERICA North (USA-Canada-Mexico)
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More detailsCD-SEM Location : ASIA (North East)
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More detailsSemi Auto Pad Shave Tool RSV Automation PDS01 Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)
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More details<b> Specification </b> Monitor 23-inch full HD (1920 x 1080 pixels) LCD monitor with 3D display function Photo Location : ASIA (North East)
Price : On request
More detailsworking condition Year(s) : 2015 Location : EUROPE (Western and Northern)
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More details300mm Nickel Plated Chuck With H325C Chiller for Tri-Temp Operation (to -25°C) Hinged Test Head Manipulator Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsOLYMPUS MX50A-F Reflected Light Microscope Five Position Motorized Turret with the Following Objective Lenses Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.