Used Metrology and inspection equipment
1,101 results* EQP-00564 & EQP-00565 * Automatic wafer inspection system * 3", 4" and 5" 6" capacity * Computer control Oly Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsViking VIS-100W Die Inspection Systems (VIS-100W Die Inspection System) * EQP-00564 & EQP-00565 * Automatic Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTencor Sigmascan Profilometer & printer (Sigmascan model 80-00110) Tencor Sigmascan. Film thickness and Surf Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTencor OmniMap NC-110 * Non-Contact Resistivity System. * Measures complex aluminum and tungsten multilayer Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsQC Optics OPTIQUEST reticle inspection Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsPrometrix FT-530e Thin Film Mapping System. Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsOPAL 7830i CD-SEM Location : AMERICA North (USA-Canada-Mexico)
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More detailsWentworth 925 (925) 6" manual probe station. Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTSK UF200 Automatic Prober * Single Cassette loader * Real time wafer map display and print * Heat up Chuck Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTSK APM90A Automatic Wafer Probers Single cassette loader -Head stage Standard -Real time wafer map display Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTSK AMP88 (AMP88) Wafer prober Location : AMERICA North (USA-Canada-Mexico)
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More detailsTeledyne TAC PR-100 Prober (TAC PR-100) Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTEL P8 Wafer prober. Bottom loader, Hot chuck. System is located in Santa Clara, CA abd available for inspect Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDymatix 680E (680E) 6" manual probe station. Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsCascade Microtech + Alessi Name: Semi-Auto Probe Station Model: REL 5500 Vintage: 1996.5 Condition: Excellen Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrand: Signatone Signatone SYS-301 Customer must supply probe heads and a Keithley 2400 multimeter Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrand: Signatone Signatone S-301-4 (Signatone S-301-4) Customer must supply probe heads and a Keithley Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsR&K 300 Probe Stations (300) Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsR&K 260 Probe Stations (260) 4" chuck with 4" X-Y travel. Bausch & Lomb Stereo Zoom Microscope. Steel ring f Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsPacific Western Prober III System (PWS Prober III System) Wafer Prober. Pacific Western Systems P3, ECN 679, Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrand: Micropositioners Micropositioners Vacuum Based Micropositioners for Signatone Probers. Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicromanipulator 6200 (6200) Manual Prober. 5¿ dia. chuck. Bausch & Lomb microzoom microscope with long work Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMICROMANIPULATOR 6000 - WAFER PROBER. 4" Chuck. Nikon Microscope. 3 Objectives: 5X, 10X, 20X. X Travel = 1 5 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsElectroglas Horizon Wafer Prober 4085X * EQP-00576 * 8 inch Automated Prober. * High volume cassette to casse Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsElectroglas 2001X Probers (2001X) Automatic Wafer Prober. Cassette to cassette wafer handling. Auto align. P Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.