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Used Metrology and inspection equipment

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1

Electroglas 2001X Probers (2001X) Automatic Wafer Prober. Cassette to cassette wafer handling. Auto align. P Location : AMERICA North (USA-Canada-Mexico)

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Electroglas 1034X-6 Prober (1034X-6) ELECTROGLAS 1034X-6: Available with 4¿, 5¿ or 6¿ chucks. X-Y Travel: 6¿ Location : AMERICA North (USA-Canada-Mexico)

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Electroglass 1034X Wafer Probe Station * Included Option D * Included Temptronics heated hot plate Location : AMERICA North (USA-Canada-Mexico)

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EG 2010 (2010) Excellent condition, high or low, cognex. Location : AMERICA North (USA-Canada-Mexico)

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Cascade 11000 Cascade 8" manual probe station. * Two positioners - Model # MH2-B * Two xyz mounts allowing po Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL IV-Hg Ellipsometer (Auto EL IV-Hg Ellipsometer) *Rudolph Auto EL-IV-Hg Multi-Wavelength Auto Location : AMERICA North (USA-Canada-Mexico)

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Rudolph FTM ellipsometer *Precise: 1nm resolution *Fast Operation: 4 seconds per measurement *Set film type, Location : AMERICA North (USA-Canada-Mexico)

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Prometrix RS-55 t/c. Tencor RS-55 t/c * 50mm - 200mm Wafers, <5mohms/sp to > Megohm/sp * Measurement Range * Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL-IV Ellipsometer * Multi-Wavelength Automatic Ellipsometer. * User can select between 3 wavel Location : AMERICA North (USA-Canada-Mexico)

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Prometrix FT-750 Prometrix FT 750 patterned mapping system, single & double layer films, 100-200mm wafers, 4 Location : AMERICA North (USA-Canada-Mexico)

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Prometrix FT-650 * Film Thickness Mapping System * Measures single or multiple layers or oxide, nitride, Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics AFT 210 * EQP-00848-SI & EQP-00870-SI (has auto loader as pictured below) * Nanometrics 210 * Fil Location : AMERICA North (USA-Canada-Mexico)

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Gaertner L116S Ellipsometer * Fully Operational * PC controlled for measurement * Simple manual stage 8" capa Location : AMERICA North (USA-Canada-Mexico)

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Veeco Dektak 3030 Profilometer * EQP-00847-SI * Operating modes: Automatic, semi automatic, manual. * Stage Location : AMERICA North (USA-Canada-Mexico)

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Laser marking Refurbished Used Equipment - Outside dimensions (LxWxH): 1000 x 1635 x 1555 mm - Weight: 450 Year(s) : 2009 Location : EUROPE (Western and Northern)

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CYBEROPTICS SE 300 ULTRA 3D Solder Paste Inspection - Inline inspection system after printer - Vintage 2008 Location : EUROPE (Central and Eastern)

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CYBEROPTICS model SE 300 ULTRA online SPI inspection machine - 508mm x 508mm card size - thickness from 0.5mm Location : EUROPE (Central and Eastern)

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Facilities: 208-240VAC 50/60Hz, 10A / Air: 60 PSI, 1 CFM Dims: 39" W x 43.3" D x 62" H @ 1100 lbs Transfer Dir Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

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Facilities: 110 VAC 1ph, 50/60Hz, 15amps / 80 psi, 2 CFM Dims: 59" x 66" x 63" @ 5,500 lbs offers complete ins Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

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Quick Set up Supplied fully working & Tested Hi Resolution 1.3 Mega Pixel Colour Camera Max. Board Year(s) : 2005 Location : EUROPE (Western and Northern)

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IR-4 Preheater 208VAC 20Amp 50/60Hz Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

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Thin film measurement system, 6"-8" Computer: Intel Pentium III Operating system: Windows NT (2) Open cassette Location : AMERICA North (USA-Canada-Mexico)

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microscope has been rebuilt to the original OEM specifications and comes complete with a Schottky emitter that Location : AMERICA North (USA-Canada-Mexico)

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100KV W or LaB6 Compustage and a single tilt holder Location : AMERICA North (USA-Canada-Mexico)

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Equipped with Magnum ion Column SFEG UHR SEM STEM capable! 5 axis stage with 100 x 100 mm XY Turbo vacuum 2 GI Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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