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ADE NanoMapper FA Nano-Defects Inspection System
Ref :
2593511-9-CP
Condition :
Used
Manufacturer :
ADE
Model :
NanoMapper FA Nano-Defects Inspection System
Year(s) :
-
Quantity :
1
Location :
Seller or machines location:
AMERICA North (USA-Canada-Mexico)
AMERICA North (USA-Canada-Mexico)
Last check :
12 Dec. 2023
Version: 300 mm
As lithography requirements shrink linewidths,
wafer nanotopographybecomes critical todevice yields.
NanoMapper FAprovideswafer production sorting capability to inspect
for “nano–defects.” Even small flaws like the one at the bottom
left can make a circuit printed in that area unusable.