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Used Semiconductor and PCB Manufacturing

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2

KLA / TENCOR 6200 SURFSCAN Details: Defect inspection system, 4"-8" Defect sensitivity: 0,09µm Sensitivi... Location : AMERICA North (USA-Canada-Mexico)

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<b>1 x YES Model: 58, Vacuum / HMDS oven</b> Power: 120V, 60Hz, 14A, 1600 watts. Location : AMERICA North (USA-Canada-Mexico)

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Includes: STEM Accessory NORAN EDX. Location : AMERICA North (USA-Canada-Mexico)

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Thin film measurement system, 6"-8" Computer: Intel Pentium III Operating system: Windows NT (2) Open cassette... Location : AMERICA North (USA-Canada-Mexico)

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ULTRATECH Saturn Spectrum 3e Wafer stepper, 4"-8" Illuminator: 1.2kw GHI Filter changer 8" Universal chuck... Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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Brand: MDC MDC CSM/2 VF6 ____________ - CV Plotter - 200mm Manual Load - Heated Chuck - HP 4284A - HP 4... Location : AMERICA North (USA-Canada-Mexico)

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KLA 2135 - Patterned Wafer Defect Inspection Tool - Throughput ~ 8-20 wph - Currently set up for 8" wafers... Location : AMERICA North (USA-Canada-Mexico)

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KLA-Tencor AIT XP - Patterned Surface Defect Inspection - 200mm/300mm Dual FIMS Asyst Loader - @130nm & 100... Location : AMERICA North (USA-Canada-Mexico)

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Brand: SDI SDI MC/PDM 300mm Fully Operational ____________ - Plasma Damage & Contamination Analysis - 300... Location : AMERICA North (USA-Canada-Mexico)

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KLA 2138 - Patterned Wafer Defect Inspection Tool (non-UBB) - Throughput ~ 15-30 wph - Currently set up for... Location : AMERICA North (USA-Canada-Mexico)

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KLA 2133 - Patterned Wafer Defect Inspection Tool - Vintage: 1997 - Throughput ~ 2-16 wph - Currently set... Location : AMERICA North (USA-Canada-Mexico)

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KLA-Tencor Thermawave OptiProbe 5340C Fully Operational - Complex Thin Film Thickness Measurement - 65nm IC... Location : AMERICA North (USA-Canada-Mexico)

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KLA-Tencor ASET-F5 - Patterned UV Film Thickness Measurement - Dual Open Cassette Configuration - ±1.0% for... Location : AMERICA North (USA-Canada-Mexico)

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KLA 2132 - Patterned Wafer Defect Inspection Tool - Vintage: 1995 - Throughput ~ 2-8 wph - Currently set u... Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics NanoSpec 9300 Fully Operational - Advanced Thin Film Thickness Measurement and Analysis - 65nm... Location : AMERICA North (USA-Canada-Mexico)

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KLA-Tencor UV1270SE - Patterned UV Film Thickness Measurement - Ballroom SMIF Configuration - ±1.5Å Oxide S... Location : AMERICA North (USA-Canada-Mexico)

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KLA 2139 - Patterned Wafer Defect Inspection Tool (UBB) - Throughput ~ 15-30 wph - Currently set up for 8"... Location : AMERICA North (USA-Canada-Mexico)

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KLA-Tencor 6220 Surfscan - Non-Patterned Surface Particle Measurement - 100wph/200mm Throughput/Wafer @ 1.2... Location : AMERICA North (USA-Canada-Mexico)

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KLA-Tencor 2401 Viper - Macro Defect Inspection System - 80wph/200mm Throughput/Wafer - 50µm sensitivity -... Location : AMERICA North (USA-Canada-Mexico)

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KLA-Tencor UV1280SE - Patterned UV Film Thickness Measurement - Dual Open Cassette Configuration - ±1.5Å Ox... Location : AMERICA North (USA-Canada-Mexico)

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KLA-Tencor AIT XP - Patterned Surface Defect Inspection - 200mm/300mm Dual FIMS Asyst Loader - @130nm & 1... Location : AMERICA North (USA-Canada-Mexico)

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KLA-Tencor Thermawave OptiProbe 5340C Fully Operational - Complex Thin Film Thickness Measurement - 65nm... Location : AMERICA North (USA-Canada-Mexico)

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SDI MC/PDM 300mm Fully Operational - Plasma Damage & Contamination Analysis - 300mm Wafers - Residual ch... Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics NanoSpec 9300 Fully Operational - Advanced Thin Film Thickness Measurement and Analysis - 65n... Location : AMERICA North (USA-Canada-Mexico)

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KLA-Tencor ASET-F5 - Patterned UV Film Thickness Measurement - Dual Open Cassette Configuration - ±1.0% f... Location : AMERICA North (USA-Canada-Mexico)

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