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Used Laboratory and Testing equipment

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Microhead sr Green probe tip (2um radius, 60 degree's),3.1 windows operating system Tencor software version 2.... Location : AMERICA North (USA-Canada-Mexico)

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This is the "Base and Handler" only for a Tencor P2. Location : AMERICA North (USA-Canada-Mexico)

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* Scan Length: 210mm. * Scan Speed: 1 um/sec to 25mm/sec. * Vertical range: +/- 6.5um at 1A resolution & +/-... Location : AMERICA North (USA-Canada-Mexico)

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Three dimensional and selected two dimensional data display. Scan length 60 mm. Step height repeatability, 0.0... Location : AMERICA North (USA-Canada-Mexico)

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* EQP-00845-SI * Resistivity measurement tool * Easy to operate, simply load the wafer and close the lid. * A... Location : AMERICA North (USA-Canada-Mexico)

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Manufacturer: Tencor Email Us Want to Service Want to Sell Related Products Mfg. Part#: Tencor P-2H Profil... Location : AMERICA North (USA-Canada-Mexico)

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System was originally set up for disks but can easily be converted for wafers. Three dimensional and selected... Location : AMERICA North (USA-Canada-Mexico)

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* Automatic Four Point Probe * Resistivity measurement tool * Digital display and computation. * Automatic ra... Location : AMERICA North (USA-Canada-Mexico)

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Non-Contact Wafer Monitor for Sheet resistance. Can accommodate up to 5". Measurement range: 1m ohm/square t... Location : AMERICA North (USA-Canada-Mexico)

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Wafer size: 125mm-200mm Temperatures up to 900C Dual wavelength technology MS Windows based software Power: 23... Location : AMERICA North (USA-Canada-Mexico)

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Non-Contact Wafer Monitor for Sheet resistance. 115v, 60 hz Location : AMERICA North (USA-Canada-Mexico)

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KLA/Tencor Flexus 2908 Wafer size: 125mm-200mm Temperatures up to 900C Dual wavelength technology MS Win... Location : AMERICA North (USA-Canada-Mexico)

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Tencor P-11 Profilometer Microhead sr Green probe tip (2um radius, 60 degree's),3.1 windows operating syste... Location : AMERICA North (USA-Canada-Mexico)

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Tencor P-2 Long Scan Profilometer * Scan Length: 210mm. * Scan Speed: 1 um/sec to 25mm/sec. * Vertical... Location : AMERICA North (USA-Canada-Mexico)

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Veeco FPP-5000 Four Point Probe * EQP-00845-SI * Resistivity measurement tool * Easy to operate, simply l... Location : AMERICA North (USA-Canada-Mexico)

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Veeco FPP 100 * Automatic Four Point Probe * Resistivity measurement tool * Digital display and computati... Location : AMERICA North (USA-Canada-Mexico)

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Tencor P-2H Long Scan Profilometer. * Scan Length: 210mm. Scan * Speed: 1 um/sec to 25mm/sec. * Vertic... Location : AMERICA North (USA-Canada-Mexico)

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Tencor P-12 Surface Profiler. System was originally set up for disks but can easily be converted for wafer... Location : AMERICA North (USA-Canada-Mexico)

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Tencor P-10 Surface Profiler. Three dimensional and selected two dimensional data display. Scan length 60 m... Location : AMERICA North (USA-Canada-Mexico)

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Tencor M-Gage 200 * Non-Contact Wafer Monitor for Sheet resistance. * Can accommodate up to 5". * Measu... Location : AMERICA North (USA-Canada-Mexico)

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Tencor M-Gage. Non-Contact Wafer Monitor for Sheet resistance. 115v, 60 hz Location : AMERICA North (USA-Canada-Mexico)

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Tencor Alpha Step 250 Profilometer (Alpha Step 250 Profilometer) The Alpha-Step 250 is used to measure ste... Location : AMERICA North (USA-Canada-Mexico)

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KLA/Tencor Flexus 2900 diffusion coefficient in dielectric films, linear regression and stress-temp or st... Location : AMERICA North (USA-Canada-Mexico)

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KLA / Tencor AlphaStep 500 Profilometer * Computer controlled Scanning and data collection * Comprehensiv... Location : AMERICA North (USA-Canada-Mexico)

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Tencor Alpha Step 300 Profilometer (Alpha Step 300 Profilometer) Location : AMERICA North (USA-Canada-Mexico)

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