Used Laboratory and Testing equipment

Windows 7 208V (2) ASRU Card - N1807-66500, (16) E4000-66550, (2) E4000-69550, (1) E9900-66504 and (1) E9900- Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Maximum Output Voltage 27.00 Volts Maximum Output Current 185.00 Amps Maximum Output Power 5.00 kW Regulati Location : AMERICA North (USA-Canada-Mexico)

Price : On request

21 Digital Oscilloscope, 100 MHz, 2 channels Location : EUROPE (Western and Northern)

Price : On request

21 Digital Oscilloscope, 100 MHz, 2 channels Location : EUROPE (Western and Northern)

Price : On request

Synthesized Signal Generator ?10 MHz to 40 GHz Location : EUROPE (Western and Northern)

Price : On request

Vector Network Analyzer - 1 MHz to 3 GHz Location : EUROPE (Western and Northern)

Price : On request

Synthesized Signal Generator ?10 MHz to 40 GHz Location : EUROPE (Western and Northern)

Price : On request

40.0GHz Signal Generator Location : EUROPE (Western and Northern)

Price : On request

Accessories Monitors Year of Manufacture 2016 Condition Good Year(s) : 2016 Location : EUROPE (Western and Northern)

Price : On request

Accessories Monitors Year of Manufacture 2018 Condition Good Year(s) : 2018 Location : EUROPE (Western and Northern)

Price : On request

Fully Automated System Inline 5 Camera System 1 Downward Looking camera (Hi Res) 4 side angle cameras 0201 Cap Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Double sided grid tester. Max. panel size: 560 x 535 mm Min. panel size: 80 x 50 mm Max. test field: 508 x 48 Year(s) : 2000 Location : EUROPE (Western and Northern)

Price : On request

Accessories Monitors Year of Manufacture 2017 Condition Good Year(s) : 2017 Location : EUROPE (Western and Northern)

Price : On request

CONTROLLERS 240VAC 60Hz Single Phase -150 - +200 degrees C Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Advantest T5376 Memory Tester (Use for Wafer level Sorting) CPU Type : SPARC MF Date: APR, 2004 Number of Test Year(s) : 2004 Location : EUROPE (Western and Northern)

Price : On request

Accessories Monitors Year of Manufacture 2016 Condition Good Year(s) : 2016 Location : EUROPE (Western and Northern)

Price : On request

Advantest T5376 Memory Tester (Use for Wafer level Sorting) CPU Type : SPARC Model: T5376 MC ID :SPN129 MF Dat Year(s) : 2004 Location : EUROPE (Western and Northern)

Price : On request

16 head flying probe max panel size 24.8" x 26.4" Year(s) : 2003 Location : EUROPE (Western and Northern)

Price : On request

Insp: Spectrometer Location : ASIA (North East)

Price : On request

System chassis: 2-module frame with 2 modules populated Controller version: RP5700 Internal power supplies: (2 Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Probe: Flying Probe Tester Vintage 2022 Year(s) : 2022 Location : EUROPE (Western and Northern)

Price : On request

Accessories Monitors Year of Manufacture 2019 Condition Good Year(s) : 2019 Location : EUROPE (Western and Northern)

Price : On request

Condition Good Power Requirements 200-208 V 175.0 A 50/60 Hz 3 Phase Year(s) : 2004 Location : EUROPE (Western and Northern)

Price : On request

SPECS: I.D. 16"W X 14"D X 12"H O.D. 24"W X 26"D X 44"H Temperature Range: -73 to +175 Deg. C - Air Cooled Ramp Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Double sided tester, grid configuration 70 mill, max test panel size top and bottom 284 x 365mm, with automa Year(s) : 2016 Location : EUROPE (Western and Northern)

Price : On request