Used Laboratory and Testing equipment

Observation Window: Yes Temperature Range: -60 to +150°C Shelf: 1 Humidity Range: None Cable Port: Φ50mm x 1 ( Year(s) : 2016 Location : ASIA (North East)

Price : On request

Year of Manufacture: 2021 Observation Window: None Temperature Range: -60°C to 150°C Shelf: 1 Humidity Range: Year(s) : 2021 Location : ASIA (North East)

Price : On request

1.Reliable Thermal Shock Testing for Automotive Excellence Ensure automotive component durability with our adv Location : ASIA (China - Taiwan - HKG)

Price : On request

• Maximum temperature: 1700°C • Controller: Digital temperature controller • Features: Maintains uniform tempe Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Digital Test Systems Year(s) : 2015 Location : EUROPE (Western and Northern)

Price : On request

• Analog channel bandwidth: 2 GHz (50 Ω), 500 MHz (1 MΩ) • Channels: 4 analog, 1 EXT, 16 digital • Built-in du Location : EUROPE (Western and Northern)

Price : On request

• Mobile-to-base station synchronization • Location update • Incoming call setup • Outgoing call setup • Mobil Location : EUROPE (Western and Northern)

Price : On request

• Bandwidth: 200 MHz • Channels: 4 analog + 1 EXT • Vertical resolution: 12-bit • Real-time sample rate: Up to Location : EUROPE (Western and Northern)

Price : On request

Tester Location : ASIA (North East)

Price : On request

Sinton Instruments FCT 450 Flash Cell Tester Light I-V Testing for Solar Cells. Advanced analysis of solar ce Location : AMERICA North (USA-Canada-Mexico)

Price : On request

ele: Precision Source/Measure Unit (SMU) Location : ASIA (North East)

Price : On request

Elec: Digital Multimeter Location : ASIA (North East)

Price : On request

Number of Test Heads 2 Year of Manufacture 1998 Condition Fair Year(s) : 1998 Location : EUROPE (Western and Northern)

Price : On request

SOC: Tester Location : ASIA (North East)

Price : On request

ele: Logic Analyzer Location : ASIA (North East)

Price : On request

Semiconductor parameter Analyzer Location : ASIA (North East)

Price : On request

vlsi: Tester Year(s) : 2000 Location : ASIA (North East)

Price : On request

EPI(Epitaxial)/6in. Year(s) : 2011 Location : ASIA (North East)

Price : On request

Can be used for thickness test of plastic films, sheets, paper, foils, silicon chip, coatings and other mater Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

• Type: Atomic Absorption Spectrometer • Status: Connected and ready for inspection Year(s) : 2008 Location : EUROPE (Western and Northern)

Price : On request

Flying Probe Tester Year(s) : 2022 Location : ASIA (North East)

Price : On request

Type: Programmable AC Power Source Power Rating: 2500 VA Location : AMERICA North (USA-Canada-Mexico)

Price : On request

• Frequency range: 9 kHz to 43 GHz • Signal purity: -85 dBc/10 kHz offset • Overall amplitude accuracy: ±0.8 d Location : AMERICA North (USA-Canada-Mexico)

Price : On request

• Manual sample positioning • Z-axis control via joystick • Tool rotation control for wire pull testing • XY a Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Up to 225lbs of force (1000 newtons) Location : AMERICA North (USA-Canada-Mexico)

Price : On request