Used Laboratory and Testing equipment

In-circuit Tester Year(s) : 2002 Location : ASIA (North East)

Price : On request

Wafer Size 200 mm Fab Section Test General Product Information Vendor Supplier Keysight Technologies Model 40 Year(s) : 1997 Location : United States (USA)

Price : On request

Vintage : MAY 1996 220V 1 Phase Specifications Flying Prober, Fixtureless Tester with AOI Vision 4 Probe High Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

25 pin kerf tester Tool ID: K264 Year(s) : 2001 Location : United States (USA)

Price : On request

Keysight 4062UX, 200mm, s/n: 2848J00897 Year(s) : 1997 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Test General Product Information Vendor Supplier Keysight Technologies Model 40 Year(s) : 1997 Location : United States (USA)

Price : On request

S630, s/n: QMO4102 Year(s) : 2010 Location : United States (USA)

Price : On request

Test frequency: 120 (100) Hz, 1 kHz and 10 kHz Meter is capable of a wide range of applications: measuring ele Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Dimensions: 14x17x17 Weight: 35.00 lbs Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Insp: Spectrometer(FTIR) Year(s) : 2019 Location : ASIA (North East)

Price : On request

Flying Probe System Build: 1998 Condition: Used – Can be used for parts OEM Part number: S20 Year(s) : 1998 Location : EUROPE (Western and Northern)

Price : On request

Model: 2287i-9739-DE Cards: 9004-0225- Pin Cards x18, 2277-4018-Clock Sync Trigger Board x1 , 2277-4021-COMBO Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Reliability Test Equipment 300mm Location : United States (USA)

Price : On request

Elec: Digital Multimeter Location : ASIA (North East)

Price : On request

Ele: LCR meter Year(s) : 2007 Location : ASIA (North East)

Price : On request

High Frequency (range) 1GHz <= 10GHz High Frequency (range) 20GHz <= 50GHz Low Frequency (range) 1kHz <= 100kH Location : AMERICA North (USA-Canada-Mexico)

Price : On request

High Frequency (range) 1GHz <= 10GHz High Frequency (range) 10GHz <= 20GHz High Frequency (range) 20GHz <= 50G Location : AMERICA North (USA-Canada-Mexico)

Price : On request

High Frequency (range) 20GHz <= 50GHz Low Frequency (range) DC <= 1kHz Location : AMERICA North (USA-Canada-Mexico)

Price : On request

High Frequency (range) 1GHz <= 10GHz Low Frequency (range) DC <= 1kHz Form Factor Benchtop Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Scientific and Laboratory Equipment 300mm, Year(s) : 2004 Location : United States (USA)

Price : On request

Flying probe tester, 4 probes Year(s) : 2003 Location : EUROPE (Western and Northern)

Price : On request

300mm, s/n: 205-0291/ 07F011 Year(s) : 2009 Location : United States (USA)

Price : 15,000 usd

Test & Measurement Year(s) : 2010 Location : United States (USA)

Price : On request

Innerlayer welder, 6 welding heads, max panel 650 x 720mm. Year(s) : 2008 Location : EUROPE (Western and Northern)

Price : On request

Temperature range -60℃ to 150℃ Shelf 1 piece Humidity range - Cable hole Φ100mm x 2 places (1 place on each Year(s) : 2021 Location : ASIA (North East)

Price : On request