Used Laboratory and Testing equipment

Advantest T5376 Memory Tester (Use for Wafer level Sorting) CPU Type : SPARC Model: T5376 MC ID :SPN129 MF Dat Year(s) : 2004 Location : EUROPE (Western and Northern)

Price : On request

16 head flying probe max panel size 24.8" x 26.4" Year(s) : 2003 Location : EUROPE (Western and Northern)

Price : On request

Insp: Spectrometer Location : ASIA (North East)

Price : On request

Probe: Flying Probe Tester Vintage 2022 Year(s) : 2022 Location : EUROPE (Western and Northern)

Price : On request

Accessories Monitors Year of Manufacture 2019 Condition Good Year(s) : 2019 Location : EUROPE (Western and Northern)

Price : On request

Condition Good Power Requirements 200-208 V 175.0 A 50/60 Hz 3 Phase Year(s) : 2004 Location : EUROPE (Western and Northern)

Price : On request

SPECS: I.D. 16"W X 14"D X 12"H O.D. 24"W X 26"D X 44"H Temperature Range: -73 to +175 Deg. C - Air Cooled Ramp Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Double sided tester, grid configuration 70 mill, max test panel size top and bottom 284 x 365mm, with automa Year(s) : 2016 Location : EUROPE (Western and Northern)

Price : On request

Xray Diffractometers, 300mm, s/n: 205934 Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Includes calibrated stereo zoom 4 Built in illumination Supports destructive and non-destructive testing Easy Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Flying Probe Machine Model 4040 Location : EUROPE (Western and Northern)

Price : On request

Test & Measurement Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Test & Measurement S630, Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Keysight 4062UX, 200mm, s/n: 2848J00938 Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

This complete used package includes: 1 Leica TS30 0.5" R1000 total station. 2 batteries. 1 charger. Extended Location : EUROPE (Western and Northern)

Price : On request

ele: Laser Diode Test Location : ASIA (North East)

Price : On request

In-Circuit Test System (MDA) Year(s) : 2015 Location : ASIA (North East)

Price : On request

Max Reel Dia: 43cm / 17” Max Reel Height: 10cm / 4” Processing Time: single reel – 10 sec. / quad count – 15 Year(s) : 2021 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size Range Minimum 150 mm Maximum 200 mm Set Size 200 mm Controller Type PC Controller Type Year(s) : 1995 Location : EUROPE (Western and Northern)

Price : On request

Test & Measurement Year(s) : 2001 Location : United States (USA)

Price : On request

Test & Measurement Year(s) : 2001 Location : United States (USA)

Price : On request

Amplitude Accuracy +/-0.3 dB Dynamic Range +30 dBM - -139 dBm Frequency Range 9 kHz - 43 GHz Input Impedance 5 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier Robotics Vision Systems i Year(s) : 2003 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Test General Product Information Vendor Supplier Keysight Technologies Model 40 Year(s) : 1997 Location : United States (USA)

Price : On request