Used Semiconductor Equipment

Scanning electron microscope (SEM) BRUKER EDS System Detector: XFlash detector 5010 Heating stage: 1000ºC CART... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Focused ion beam (FIB) system 2004 vintage. Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

CD Scanning Electron Microscope (SEM) Main unit Control unit Power supply unit Wafer transfer unit (4) Anti vi... Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

RTP System, 8" RTP Mainframe Nickel plated Wide body loadlocks OTF Centre finder Chambers: A & B E & F Single... Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Etcher Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Transmission Electron Microscope (TEM) Image mode: TEM / EFTEM / STEM Acc voltage: 300 kV, FEG Schottky FEG 0.... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

FE Scanning electron microscope (FE-SEM), 8" Main unit: Fe tip: HITACHI FE Tip (Vext 4.2) (4) Barion ion pump... Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Mask aligner Chuck, 4" (Soft+hard+vac contact) Chuck, 6" (Edge handling, proximity only) Exposure light, Ø 6”... Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Focused Ion Beam (FIB) system Prelens ion column 4-Axis stage, 50mm Secondary detector: CDEM (3) Gas injectio... Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Mask aligner, 2"-6" Lamp house: 1000 W Lamp power supply: CIC00 / 1000 Exposure optics for UV400 Exposure time... Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Focused ion beam (FIB) system Dual beam. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

6" Top side alignment Large gap alignment. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

(2) RF Carts ESC Optical non‐contact Particle reduction Orbital gas panel Download recipe He flow control mode... Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Oxide dry etcher Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Thin film stress measurement system No computer or monitor Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

ASP Chamber SPARE PARTS Location : AMERICA North (USA-Canada-Mexico)

Price : On request

WxZ CVD Chamber for Centura, 8". spare part Location : AMERICA North (USA-Canada-Mexico)

Price : On request

AMAT / APPLIED MATERIALS Chamber for Centura DxZ Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Focused ion beam (FIB) system Dual beam Includes: Main strata DB system Chiller Vacuum pump Monitor Platform... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Scanning Electron Microscope (SEM) Operating system: Windows Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Mask aligner Top side alignment CIC 1000x Power supply PC Type: DYAN AT 100 Relay interbox DVM6 TSA Microscope... Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Etcher, 8" Turbo upgraded No ESC TAC Type VAT Valves & Controllers. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Mask aligner, 2"-6" Manual wafer load mask aligner Topside alignment (TSA) ±1.0µ[email protected]σ Resolution: <1µm in vacuu... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Double sided aligner, 6"-8" UV Light: UV400 HR Lamps: MG1000W Working: 446 Hours Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Dual beam Focused Ion Beam system (FIB) Without loadlock With regular stub sample holder Process: Xsection pre... Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)

Price : On request