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Used Semiconductor Equipment

2,002 results
1

Rudolph AutoEL IV Ellipsometer Wafer Size 6" Vintage 1985-7 *. Thin Film Thickness Measurement system. *... Year(s) : 1985 Location : ASIA (North East)

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1

Thermawave OP2600 Wafer Size 8" Vintage 1994-12 The Therma-Wave Opti-Probe 2600 and 2690 are used for mea... Year(s) : 1994 Location : ASIA (North East)

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1

Metal etcher. Location : AMERICA North (USA-Canada-Mexico)

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1

Etcher, 6" Can be configured to 4"-8" Type: Wye Wiring termination: Hard-wired Process gas requirements: Gases... Location : AMERICA North (USA-Canada-Mexico)

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9
Surface Mount Production Equipment

Sale Details Due to the Bankruptcy of Viapaq SAS (assembles, manufactures and supplies printed circuit boards... Location : France

Hilco Industrial
Apr, 24

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2

Audionvac Model: VM303 Type: Sealer Quantity: 1 Location: Rambouillet, France Audionvac 'VM303' Vacuum Seale... Location : France

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2

Nilfisk GB826 Type: Extractor S/N: C B1 NR502 01 2000 Quantity: 1 Location: Rambouillet, France Nilfisk 'GB8... Location : France

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2

Ruwac DS 1221-LS M Type: Vacuum S/N: DS1 20124211 Quantity: 1 Location: Rambouillet, France Ruwac 'DS 1221-L... Location : France

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4

Teradyne Model: CSC 114 79 Type: Vacuum Pump S/N: TSLH F670 Year: 2012 Quantity: 1 Location: Rambouillet, Fra... Year(s) : 2012 Location : France

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3

Votsch Industrietechnik VT 4034 Type: Chamber S/N: 58566014890010 Year: 2000 Quantity: 1 Location: Rambouillet... Year(s) : 2000 Location : France

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3

ASYS Model: ALS03 Type: Extractor S/N: 0211979 Year: 2007 Quantity: 1 Location: Rambouillet, France ASYS 'AL... Year(s) : 2007 Location : France

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9

ASYS Insignum 2000 Type: Extractor S/N: 042129 Year: 2011 Quantity: 1 Location: Rambouillet, France ASYS 'In... Year(s) : 2011 Location : France

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4

Inspection Unit Quantity: 1 Location: Rambouillet, France LED Inspection station Approx. Footprint 1800 (W)... Location : France

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1

Tencor P-2 Step Height Measurement System - Wafer Size 8" - Long Scan Profiler Measurement. - Standard He... Location : ASIA (North East)

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1

Tencor P-20(H) Step Height Measurement System - Wafer Size 8" - Scan Speed : 1㎛ ~ 25 mm/sec. - Stylus For... Location : ASIA (North East)

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1

Tencor P-20(H) Step Height Measurement Sytem - Wafer Size 8" - Scan Length: 210mm. - Scan Speed : 1㎛ ~ 25... Location : ASIA (North East)

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3

Seremap Shuttle S/N: P001025 05 0016 Year: 2007 Quantity: 1 Location:Rambouillet, France Seremap Shuttle -... Year(s) : 2007 Location : France

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1

Equipment Details: System No pumps No chillers No RF Carts. Location : AMERICA North (USA-Canada-Mexico)

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1

Wafer Size:8" Equipment Details: Etcher, 8" Hours: 109185 Mainframe: WVDS On board AC dist type: Circuit brea... Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)

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1

Power supply: CIC 1000 PC type: TYAN / FN 9160015 Relay interlock box TSA microscope TSA objectives: 5x / 0.15... Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

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1

Power supply: CIC 1200 PC Type: DSM-P233 MMX Relay interlock box TSA camera: XC-50 TSA objectives: 5 x / 0.15,... Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)

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1

2D Inline Automated Optical Inspection PN 7299581 - FX-940 2D Inline Automated Optical Inspection (AOI) System... Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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1

Auto bonder, 8" For advanced MEMS manufacturing and 3D wafer bonding Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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Scanning Electron Microscope (SEM) Detectors: SE, BSE, LFD (Low vac) & GSED (ESEM) OXFORD EBSD (2014) (4) Fore... Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

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1

Chambers for Centura IPS Location : AMERICA North (USA-Canada-Mexico)

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Chambers for Centura ASP Location : AMERICA North (USA-Canada-Mexico)

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