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Used Semiconductor Equipment

2,103 results
1

Wafer Size:8" Equipment Details: Etcher, 8" Hours: 109185 Mainframe: WVDS On board AC dist type: Circuit brea... Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)

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1

Power supply: CIC 1000 PC type: TYAN / FN 9160015 Relay interlock box TSA microscope TSA objectives: 5x / 0.15... Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

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1

Power supply: CIC 1200 PC Type: DSM-P233 MMX Relay interlock box TSA camera: XC-50 TSA objectives: 5 x / 0.15,... Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)

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1

2D Inline Automated Optical Inspection PN 7299581 - FX-940 2D Inline Automated Optical Inspection (AOI) System... Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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1

Auto bonder, 8" For advanced MEMS manufacturing and 3D wafer bonding Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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Scanning Electron Microscope (SEM) Detectors: SE, BSE, LFD (Low vac) & GSED (ESEM) OXFORD EBSD (2014) (4) Fore... Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

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1

Chambers for Centura IPS Location : AMERICA North (USA-Canada-Mexico)

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1

Chambers for Centura ASP Location : AMERICA North (USA-Canada-Mexico)

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2

RF Plasma barrel etcher Location : EUROPE (Western and Northern)

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1

Mask aligner Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Mask aligner, 2" Backside IR Lamp house: 350 W CIC1200 Power supply DVCU Box Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

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1

Transmission Electron Microscope (TEM) LaB6 Filament 404h With cryo-box Retro with TWIN lens with holder With... Location : AMERICA North (USA-Canada-Mexico)

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Focused Ion Beam (FIB) system Operating system: Upgraded to Windows XP With hardware. Location : AMERICA North (USA-Canada-Mexico)

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Defect review SEM RS 4-Point probe capable, 8"-12" EDX Open cassette system. Location : AMERICA North (USA-Canada-Mexico)

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Scanning electron microscope (SEM) BRUKER EDS System Detector: XFlash detector 5010 Heating stage: 1000ºC CART... Location : AMERICA North (USA-Canada-Mexico)

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Focused ion beam (FIB) system 2004 vintage. Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)

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1

CD Scanning Electron Microscope (SEM) Main unit Control unit Power supply unit Wafer transfer unit (4) Anti vi... Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)

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1

RTP System, 8" RTP Mainframe Nickel plated Wide body loadlocks OTF Centre finder Chambers: A & B E & F Single... Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

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2

Etcher Location : AMERICA North (USA-Canada-Mexico)

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1

Transmission Electron Microscope (TEM) Image mode: TEM / EFTEM / STEM Acc voltage: 300 kV, FEG Schottky FEG 0.... Location : AMERICA North (USA-Canada-Mexico)

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FE Scanning electron microscope (FE-SEM), 8" Main unit: Fe tip: HITACHI FE Tip (Vext 4.2) (4) Barion ion pump... Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

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Mask aligner Chuck, 4" (Soft+hard+vac contact) Chuck, 6" (Edge handling, proximity only) Exposure light, Ø 6”... Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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Focused Ion Beam (FIB) system Prelens ion column 4-Axis stage, 50mm Secondary detector: CDEM (3) Gas injectio... Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

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Mask aligner, 2"-6" Lamp house: 1000 W Lamp power supply: CIC00 / 1000 Exposure optics for UV400 Exposure time... Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

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Focused ion beam (FIB) system Dual beam. Location : AMERICA North (USA-Canada-Mexico)

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