Used Semiconductor and PCB Manufacturing

Nanometrics Nanospec AFT 200 * Manual system Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics AFT 210UV * Nanometrics 210UV * Film Measurement System * Stage - 4" wafers - larger stage c... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 210XP Film Measurement System. *System is in excellent "like new" condition. *R... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor OmniMap NC-110 * Non-Contact Resistivity System. * Measures complex aluminum and tungsten multilay... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Rudolph Auto EL III Ellipsometer EQP-00470 * Serial tag info: 24A, Serial # 7367, June 1983 * Ellipsometer... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Rudolph Auto EL III Ellipsometer *Serial Tag info: 2C4C, Serial # 7511, July/1984 *Ellipsometer, 633nm wav... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Rudolph Auto EL II Ellipsometer *Ellipsometer, 633nm wavelength *Built-in printer *Measuring Time: 17 to... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Rudolph FE IV Ellipsometer Specifications: System: The Rudolph FE III series is a focused beam ellipsomete... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

QC Optics OPTIQUEST reticle inspection Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Prometrix FT-530e Thin Film Mapping System. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

OPAL 7830i CD-SEM Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline AFT 4000 * Table top automated film thickness and reflectivity system. * Standard F... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics 215 Automated Film Thickness Tool. * Cassette to cassette operation. 3¿ to 6¿ wafer capability... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 181 (Nanospec AFT 181) Computerized Film Thickness Measurement Nanometrics 181. M... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 181 (Nanospec AFT 181) Computerized Film Thickness Measurement Nanometrics 181 wi... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 180 (Nanospec AFT 180) Nanometrics 180 * Microspectrophotometer head can measure... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 180 (Nanospec AFT 180) Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec 6100 The 6100 measures film thickness in the range of 200Å - 30µm with the visible li... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline V CD Measure Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline IV CD Measure Measures line widths, gaps, holes and registration alignment. Range 0.5... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

MTI Flexifab Photoresist Track * Process configuration is Send/Develop/Bake/Bake/Receive. * Capable of ha... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Gaertner Dual Wavelength Mapping System (L125B) * He-Ne 6328A red laser * He-Cd 4416A blue laser * Auto... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline CRD III Measure (Nanoline CRD III Measure) Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline CD 50 Measure (Nanometrics Nanoline CD 50) Nanometrics Nanoline CD 50 Line width Meas... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline 50 CD Measurement System - Model Nanoline 50, Main System - Capable of Measuring up t... Location : AMERICA North (USA-Canada-Mexico)

Price : On request