Amray 1920ECO Scanning Electron Microscope
AMERICA North (USA-Canada-Mexico)
Thick specimens with height approximately 1.0 mm
to 25 mm can be imaged.
Ordinary materials, such as metals, ceramics, polymers
and machined or stamped materials, concretes
and other solid materials can be imaged.
Filament change and electron column alignment can be performed easily.
Elemental X-ray analysis can be performed
with an optional EDS system, and the images can be captured in digital format
Resolution of ~ 5-10 nm and a magnification
of 100kx can be obtained under optimum conditions.