FEI Magellan SEM scanning electron microscope

Ref : 2040551-18-CP

Condition : Used

Manufacturer : FEI

Model : Magellan SEM

Short Description : scanning electron microscope

Year(s) : 2009

Quantity : 1

Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)

Last check : 26 Feb. 2025

Elstar XHR electron column, 300v–30kV, Schottky FEG
In lens SE and BSE detector
Everhart-Thornley SE detector (ETD)
vCD backscatter detector
solid state retractable
Win xP OS and FEI xT UI; TSS
networking computer to make IT happy
Five-axis motorized piezo driven compucentric stage
Full coverage for 100mm samples
100mm load lock
Chamber scope for real time observation
Vacuum System: oil free, column IGP x 2
air cooled Turbo and dry PVP

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