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GE Nanotome | m
Ref :
2374621-3-MT
Condition :
Used
Manufacturer :
-
Model :
GE Nanotome | m
Year(s) :
-
Quantity :
1
Location :
Seller or machines location:
EUROPE (Western and Northern)
EUROPE (Western and Northern)
GE Nanotome | m
180 kV / 15 W nanoCT® system for high-resolution structural analysis and 3D metrology
Measurement volume
Max. Sample size 240 mm Ø x 250 mm height
Up to 0.3 μm min.voxel size
Year of construction: 2014
Measuring system: Nanofocus X-ray
Measurement software: Datos
Accuracy: 7 µm + L / 100
Detectability of details up to 200 nm
X-Ray hours: approx. 2740h
Last maintenance 11/2020
further technical details on request.
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