GE Nanotome | m

Ref : 2374621-3-MT

Condition : Used

Manufacturer : -

Model : GE Nanotome | m

Year(s) : -

Quantity : 1

Location : Seller or machines location:
EUROPE (Western and Northern)

Last check : 13 Nov. 2024

GE Nanotome | m
180 kV / 15 W nanoCT® system for high-resolution structural analysis and 3D metrology

Measurement volume
Max. Sample size 240 mm Ø x 250 mm height
Up to 0.3 μm min.voxel size
Year of construction: 2014
Measuring system: Nanofocus X-ray
Measurement software: Datos
Accuracy: 7 µm + L / 100
Detectability of details up to 200 nm
X-Ray hours: approx. 2740h
Last maintenance 11/2020
further technical details on request.

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