Jeol JSM IT700HR

Scanning electron microscope.
Equipment including the following features:
Magnification range: 5x – 600,000x
Acceleration voltage: 0.5 – 30 kV
Patented InLens Schottky emitter.
Dual condenser system for loss-free electron extraction.
Continuous beam current adjustment without aperture change.
Maximum beam current up to over 300 nA.
Optimized specimen chamber geometry for imaging and analytics.
Fully motorized heavy-duty specimen stage with eucentric tilt
and rotation for samples up to 20 cm Ø and 2 kg weight.
Travel ranges: X: 125 mm, Y: 100 mm, Z: 80 mm, T: -10° ~ 90°, R: 360°. Secondary electron detector.
Energy-filtered SE detection (REF mode).
Fully automatic switching between high and low vacuum range
via software without aperture adjustment.
Image storage up to 5,120 x 3,840 pixels.
Image acquisition up to over 100,000 x 100,000 pixels.
Automatic pumping system with turbopump and ultra-quiet
fore-vacuum pump.
PC hardware-independent and fully remote-operable
user software.
Compact footprint: 0.78 m².
Integrated compressed air damping system.
Low-maintenance system without water cooling and nitrogen.
Castors for mobile use.
Backscattered electron detector.
Workstation with Windows 10.
23" monitor.
Keyboard/mouse set.