AMERICA North (USA-Canada-Mexico)
FEI FIB 200 M
The FEI FIB 200 M is one of our focused ion beam microscopes. The instrument comes remanufactured to its original OEM specs and is equipped with:
Remanufactured FIB 200 with Magnum column for precise milling
5 axis stage with 50 x 50 mm XY
2 GIS are included, 2 more are optional; you pick!
Install and custom configuration available.