Hewlett Packard (HP) 4279A Test Equipment

Features
C-V measurement for performing doping profile of wafers.
C-V characterization and sorting of varactor diodes.
Capacitance testing of rf mixer and switching diodes.
Testing capacitors with an applied DC bias for incoming inspection.
Measurement Time: 10ms/20ms/30ms
Measurement Accuracy: 0.1% (20ms)
Internal DC Bias: 0 to +/-38V, 0.1% programmable sweep
Measurement Range: 0.00001pF to 1280pF
Condition Very Good
Exterior Dimensions
Width 16.750 in (42.5 cm)
Depth 20.750 in (52.7 cm)
Height 7.000 in (17.8 cm)
Weight 31 lb (14 kg)