Jeol IB-09010CP

• Process Type: Argon ion beam milling
• Application: Cross section preparation
• Surface Finish Capability: Mirror polishing
• Material Capability: Hard materials
• Sample Holder: Continuously rotating
• Sample Positioning: High power optical microscope
• Positioning Accuracy: Within a few microns
• Milling Motion: Automatic rocking to prevent beam striations
• Ion Beam Type: Argon
• Ion Implantation: No argon implantation due to glancing incidence beam
• Voltage: 100–120 V
• Frequency: 50/60 Hz
• Current: 5 A