AMERICA North (USA-Canada-Mexico)
Nanometrics Nanospec AFT 210XP Film Measurement System.
*System is in excellent "like new" condition.
*Readu for immediate shipment.
*Range of Thicknesses: 100 to 500,000 angstroms
*Spot Size: 50 um with 5x objective, 25 um with 10x objective
50 um with 50x objective
*Film Types: Oxide on Silicon; Nitride on Silicon; Negative
Resist on Silicon; Polysilicon on Oxide; Negative Resist on
Oxide; Nitride on Oxide; Polyimide on Silicon; Positive Resist
on Silicon; Positive Resist on Oxide;
*Reflectance Mode; Thick Films, Reproducibility: 2A ±
depending upon the film type,
*Typical Measurement Time: 2.5 seconds.