NexTest Magnum 1 PV Test Equipment

Configuration
- Wafer sort applications from engineering to high volume production
- 512 I/O pins 128/256 Power
- Single chassis manipulator mount

Memory
- NOR Flash / NAND Flash / SRAM / DRAM / EEPROM

Single, Scalable Platform
- Scales from low-channel count engineering solutions to high-channel count production solutions with superior throughput and high parallel test efficiency
- One platform tests a variety of memory and logic devices, including Memory, Embedded Memory and Logic Test

Multisite Architecture
- Highly parallel tester architecture automates the task of testing up to 640 devices in parallel