Used Laboratory and Testing equipment
1,718 resultsSeries make up a family of analog video waveform/vector monitors with progressive features in support of today Location : EUROPE (Western and Northern)
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More details◆ Video and FFT analyzer ◆ 3-channel oscilloscope ◆ Vectorscope ◆ Monitor ◆ Four video-signal inputs with 9 MH Location : EUROPE (Western and Northern)
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More details2 GHZ DIGITAL OSCILLOSCOPE, 4 CHANNEL Location : EUROPE (Western and Northern)
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More detailsSpecifications: Temp Range: - Operating +0°C to +55°C - Storage -40°C to +70°C Hum Location : AMERICA North (USA-Canada-Mexico)
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More detailsand collapsible Column grid array (CGA) Capacitor – chip and polarized Chip scale package (CSP) Surface mount Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
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More detailsNickel chuck Tri-temp Single cassette OCR: Cognex 4200 Fail mark, needle inspection Auto n Location : AMERICA North (USA-Canada-Mexico)
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More details* EQP-00845-SI * Resistivity measurement tool * Easy to operate, simply load the wafer and close the lid. * A Location : AMERICA North (USA-Canada-Mexico)
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More detailsThis is the "Base and Handler" only for a Tencor P2. Location : AMERICA North (USA-Canada-Mexico)
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More detailsManufacturer: Tencor Email Us Want to Service Want to Sell Related Products Mfg. Part#: Tencor P-2H Profil Location : AMERICA North (USA-Canada-Mexico)
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More details* Scan Length: 210mm. * Scan Speed: 1 um/sec to 25mm/sec. * Vertical range: +/- 6.5um at 1A resolution & +/- Location : AMERICA North (USA-Canada-Mexico)
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More detailsSystem was originally set up for disks but can easily be converted for wafers. Three dimensional and selected Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicrohead sr Green probe tip (2um radius, 60 degree's),3.1 windows operating system Tencor software version 2. Location : AMERICA North (USA-Canada-Mexico)
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More detailsThree dimensional and selected two dimensional data display. Scan length 60 mm. Step height repeatability, 0.0 Location : AMERICA North (USA-Canada-Mexico)
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More detailsNon-Contact Wafer Monitor for Sheet resistance. Can accommodate up to 5". Measurement range: 1m ohm/square t Location : AMERICA North (USA-Canada-Mexico)
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More detailsNon-Contact Wafer Monitor for Sheet resistance. 115v, 60 hz Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer size: 125mm-200mm Temperatures up to 900C Dual wavelength technology MS Windows based software Power: 23 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSingle Foup Wide Chuck temp: -25C to +150C ERS AirCool and high power chuck/chiller GPIB I/F Board SACC Z-WAPP Location : AMERICA North (USA-Canada-Mexico)
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More detailsUP800, 128 I/O channel boards 400Mpbs 256Mb memory Scan enabled Passing diagnostics Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe 8011A Pulse Generator is a versatile, reliable, low cost generator featuring ease of operation from the lo Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe 5315B Frequency Counter has a 100MHz frequency range and also has ratio and totalize measurement capabilit Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe HP/Agilent 8158B is a programmable optical attenuator for singlemode and multimode optical fibers with a n Location : AMERICA North (USA-Canada-Mexico)
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More detailsPCS Adapter Location : AMERICA North (USA-Canada-Mexico)
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More details200 V DC Power Supply Module The Agilent 66000 modular power system simplifies test-system assembly, cabling Location : AMERICA North (USA-Canada-Mexico)
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More detailsPulse Generator Mainframe Location : AMERICA North (USA-Canada-Mexico)
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More detailsFrequency Counter, 10Hz-225MHz Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Laboratory and Testing equipment on Wotol
For second hand Laboratory and Testing equipment we have Laboratory equipmentand Testing instrument for electronics. The main manufacturers for used Laboratory and Testing equipment are Agilent, Keysight, Hewlett Packard (HP), Tektronix, Anritsu, Teradyne, Keithley, Rohde & Schwarz, Tencor, Acterna, Advantest, Dage, Rudolph, Nanometrics. The main models are