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Used Laboratory and Testing equipment

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Tencor Alpha Step 300 Profilometer (Alpha Step 300 Profilometer) Location : AMERICA North (USA-Canada-Mexico)

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Veeco Dektak 3030ST Auto II Profilometer. * Measurement Range: 50A to 1,310KA * Verticle Resolution: 1A * Sc Location : AMERICA North (USA-Canada-Mexico)

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Brand: Signatrone Signatrone 4 point probe * Model # 301-4 * Customer must purchase a Keithley (or equivalen Location : AMERICA North (USA-Canada-Mexico)

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Brand: Signatrone Signatrone 4 point probe * Model 301 * Customer must purchase a Keithley (or equivalent) d Location : AMERICA North (USA-Canada-Mexico)

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Brand: Semiconductor Diagnostics Inc Semiconductor Diagnostics Inc. SPV CMS 4010 (SPV CMS 4010) * Model SPV Location : AMERICA North (USA-Canada-Mexico)

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Rudolph FTM ellipsometer *Precise: 1nm resolution *Fast Operation: 4 seconds per measurement *Set film type, Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL IV-Hg Ellipsometer Rudolph Auto EL-IV-Hg Multi-Wavelength Automatic Ellipsometer *User can se Location : AMERICA North (USA-Canada-Mexico)

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Keysight-Agilent E3644A Agilent basic DC power supplies offer essential features for a tight budget. The sing Location : AMERICA North (USA-Canada-Mexico)

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Keysight-Agilent 33320H The 33320H Programmable OEM Step Attenuator provides an attenuation range of 1 to 11 Location : AMERICA North (USA-Canada-Mexico)

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Keysight-Agilent E3649A Output Ratings (@ 0 degrees C to 40 degrees C) 2 Outputs Range 1: 0 to 35 V / 1.4 A R Location : AMERICA North (USA-Canada-Mexico)

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Keysight-Agilent 3312A The 3312A Function Generator is an effective, low cost solution for generating a multi Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanospec AFT 200 * Manual system Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics AFT 210UV * Nanometrics 210UV * Film Measurement System * Stage - 4" wafers - larger stage can b Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanospec AFT 210XP Film Measurement System. *System is in excellent "like new" condition. *Read Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL III Ellipsometer EQP-00470 * Serial tag info: 24A, Serial # 7367, June 1983 * Ellipsometer, 6 Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL III Ellipsometer *Serial Tag info: 2C4C, Serial # 7511, July/1984 *Ellipsometer, 633nm wavele Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL II Ellipsometer *Ellipsometer, 633nm wavelength *Built-in printer *Measuring Time: 17 to 50 Location : AMERICA North (USA-Canada-Mexico)

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Rudolph FE IV Ellipsometer Specifications: System: The Rudolph FE III series is a focused beam ellipsometer f Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanoline AFT 4000 * Table top automated film thickness and reflectivity system. * Standard Film Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics 215 Automated Film Thickness Tool. * Cassette to cassette operation. 3¿ to 6¿ wafer capability. Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanospec AFT 181 (Nanospec AFT 181) Computerized Film Thickness Measurement Nanometrics 181. Mic Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanospec AFT 181 (Nanospec AFT 181) Computerized Film Thickness Measurement Nanometrics 181 with Location : AMERICA North (USA-Canada-Mexico)

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Keysight-Agilent 1143A Agilent 1143A independently powers the Agilent 54701A Programmable offset +/-50 V offs Location : AMERICA North (USA-Canada-Mexico)

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Keysight-Agilent 5383A The 5383A 520 MHz Frequency Counter is designed to deliver reliable, high quality oper Location : AMERICA North (USA-Canada-Mexico)

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Keysight-Agilent 34401A The 34401A is a 6.5 digit , high performance digital multimeter. Its combination of b Location : AMERICA North (USA-Canada-Mexico)

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You can find used Laboratory and Testing equipment on Wotol

For second hand Laboratory and Testing equipment we have Laboratory equipmentand Testing instrument for electronics. The main manufacturers for used Laboratory and Testing equipment are Agilent, Keysight, Hewlett Packard (HP), Tektronix, Anritsu, Teradyne, Keithley, Rohde & Schwarz, Tencor, Acterna, Advantest, Dage, Rudolph, Nanometrics. The main models are 

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