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Used Laboratory and Testing equipment

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1

Keysight/Agilent E4421B Analog RF Signal Generator, 250kHz to 3GHz Specifications 250kHz to 3GHz Flexible arc Location : AMERICA North (USA-Canada-Mexico)

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Keysight/Agilent E4431B RF Signal Generator, 250kHz to 2GHz Specifications 250kHz to 2GHz frequency range RF Location : AMERICA North (USA-Canada-Mexico)

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Keysight/Agilent E8257C PSG Analog Signal Generator, up to 40GHz Specifications Broad frequency ranges: 250kH Location : AMERICA North (USA-Canada-Mexico)

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Keysight/Agilent E4436B Digital Signal Generator, 250 kHz to 3 GHz Specifications Frequency Range: 250 kHz to Location : AMERICA North (USA-Canada-Mexico)

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Keysight/Agilent E4438C Vector Signal Generator; 250kHz to 4GHz Specifications Frequency range 250kHz to 4GHz Location : AMERICA North (USA-Canada-Mexico)

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Keysight/Agilent N5182A MXG Vector Signal Generator, 250kHz to 6GHz 100kHz to 3 or 6GHz >+23dBm up to 3GHz us Location : AMERICA North (USA-Canada-Mexico)

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Keysight/Agilent N9310A RF Signal Generator, 9kHz to 3GHz Specifications 9kHz to 3GHz CW output, 20Hz to 80kH Location : AMERICA North (USA-Canada-Mexico)

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Keysight/Agilent/HP 8648C Signal Generator; 9kHz to 3.2GHz Specifications 9kHz to 3.2GHz Superior level accur Location : AMERICA North (USA-Canada-Mexico)

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SYSTEM OPTIONS: 21-slot Testhead Computer Type Manipulator Type Docking Type INSTRUMENT OPTIONS: DVI-300 DVI-2 Location : AMERICA North (USA-Canada-Mexico)

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Single Foup Wide Chuck temp: -25C to +150C ERS AirCool and high power chuck/chiller GPIB I/F Board SACC Z-WAPP Location : AMERICA North (USA-Canada-Mexico)

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UP800, 128 I/O channel boards 400Mpbs 256Mb memory Scan enabled Passing diagnostics Location : AMERICA North (USA-Canada-Mexico)

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CONFIGURATION OF DPU TEST HEAD 1 DC CONFIGURATION [1-64] ...........> 64 PPS CONFIGURATION [1-256] ..........> Location : AMERICA North (USA-Canada-Mexico)

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PinScale 800 or 3600 SOC Test System Large or Small Test Head systems available PS800 channel cards with 64M V Location : AMERICA North (USA-Canada-Mexico)

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SYSTEM OPTIONS: 32-Slot STH 64-Slot LTH Computer Type Manipulator Type Interface/Docking Type INSTRUMENT OPTIO Location : AMERICA North (USA-Canada-Mexico)

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SYSTEM OPTIONS: 20-slot Testhead 40-slot Testhead 60-slot Testhead Computer Type Manipulator Type Docking Type Location : AMERICA North (USA-Canada-Mexico)

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SYSTEM OPTIONS: LX 20-Slot System MX 40-Slot System EX 80-Slot System PAx System INSTRUMENT OPTIONS: FX Digita Location : AMERICA North (USA-Canada-Mexico)

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SYSTEM OPTIONS: 20-slot Testhead Computer Type Manipulator Type Docking Type INSTRUMENT OPTIONS: DPIN96 (DD109 Location : AMERICA North (USA-Canada-Mexico)

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SYSTEM OPTIONS: 31-slot Testhead Computer Type Manipulator Type Docking Type INSTRUMENT OPTIONS: DVI-300 DVI-2 Location : AMERICA North (USA-Canada-Mexico)

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TEST SITES: 16-Site (8x2) 8-Site (4x2) Square 4-Site (2x2) In-Line 4-Site (4x1) 2-Site (2x1) Busy Shuttle (Sin Location : AMERICA North (USA-Canada-Mexico)

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In-Circuit Test / ICT Location : AMERICA North (USA-Canada-Mexico)

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SERIES MODELS: NS-7000 NS-7080 NS-7080W NS-7160W TEST SITES: 16-Site (8x2) 8-Site (4x2) Square 4-Site (2x2) In Location : AMERICA North (USA-Canada-Mexico)

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Systems are fully disassembled and cleaned PCBs are cleaned and updated to meet current working ECO revisions Location : AMERICA North (USA-Canada-Mexico)

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Systems are fully disassembled and cleaned PCBs are cleaned and updated to meet current working ECO revisions Year(s) : 0 Location : AMERICA North (USA-Canada-Mexico)

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GenRad TS87 15 Combo IIA Pin Boards Analog Functional Test Module (AFTM) 2 Alliance I 0-7V Power Supplies 3 A Location : AMERICA North (USA-Canada-Mexico)

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GenRad TS128L 22 - UltraPin 1 (128L) Pin Boards (5,632 test points) 1 - Frequency Time Interval Instrument 1 Location : AMERICA North (USA-Canada-Mexico)

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You can find used Laboratory and Testing equipment on Wotol

For second hand Laboratory and Testing equipment we have Laboratory equipmentand Testing instrument for electronics. The main manufacturers for used Laboratory and Testing equipment are Agilent, Keysight, Hewlett Packard (HP), Tektronix, Anritsu, Teradyne, Keithley, Rohde & Schwarz, Tencor, Acterna, Advantest, Dage, Rudolph, Nanometrics. The main models are 

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