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Used Metrology and inspection equipment

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TSK UF200 Automatic Prober * Single Cassette loader * Real time wafer map display and print * Heat up Chuck Location : AMERICA North (USA-Canada-Mexico)

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TSK APM90A Automatic Wafer Probers Single cassette loader -Head stage Standard -Real time wafer map display Location : AMERICA North (USA-Canada-Mexico)

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TSK AMP88 (AMP88) Wafer prober Location : AMERICA North (USA-Canada-Mexico)

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Teledyne TAC PR-100 Prober (TAC PR-100) Location : AMERICA North (USA-Canada-Mexico)

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TEL P8 Wafer prober. Bottom loader, Hot chuck. System is located in Santa Clara, CA abd available for inspect Location : AMERICA North (USA-Canada-Mexico)

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Dymatix 680E (680E) 6" manual probe station. Location : AMERICA North (USA-Canada-Mexico)

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Cascade Microtech + Alessi Name: Semi-Auto Probe Station Model: REL 5500 Vintage: 1996.5 Condition: Excellen Location : AMERICA North (USA-Canada-Mexico)

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Brand: Signatone Signatone SYS-301 Customer must supply probe heads and a Keithley 2400 multimeter Location : AMERICA North (USA-Canada-Mexico)

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Brand: Signatone Signatone S-301-4 (Signatone S-301-4) Customer must supply probe heads and a Keithley Location : AMERICA North (USA-Canada-Mexico)

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R&K 300 Probe Stations (300) Location : AMERICA North (USA-Canada-Mexico)

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R&K 260 Probe Stations (260) 4" chuck with 4" X-Y travel. Bausch & Lomb Stereo Zoom Microscope. Steel ring f Location : AMERICA North (USA-Canada-Mexico)

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Pacific Western Prober III System (PWS Prober III System) Wafer Prober. Pacific Western Systems P3, ECN 679, Location : AMERICA North (USA-Canada-Mexico)

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Brand: Micropositioners Micropositioners Vacuum Based Micropositioners for Signatone Probers. Location : AMERICA North (USA-Canada-Mexico)

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Micromanipulator 6200 (6200) Manual Prober. 5¿ dia. chuck. Bausch & Lomb microzoom microscope with long work Location : AMERICA North (USA-Canada-Mexico)

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MICROMANIPULATOR 6000 - WAFER PROBER. 4" Chuck. Nikon Microscope. 3 Objectives: 5X, 10X, 20X. X Travel = 1 5 Location : AMERICA North (USA-Canada-Mexico)

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Electroglas Horizon Wafer Prober 4085X * EQP-00576 * 8 inch Automated Prober. * High volume cassette to casse Location : AMERICA North (USA-Canada-Mexico)

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Electroglas 2001X Probers (2001X) Automatic Wafer Prober. Cassette to cassette wafer handling. Auto align. P Location : AMERICA North (USA-Canada-Mexico)

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Electroglas 1034X-6 Prober (1034X-6) ELECTROGLAS 1034X-6: Available with 4¿, 5¿ or 6¿ chucks. X-Y Travel: 6¿ Location : AMERICA North (USA-Canada-Mexico)

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Electroglass 1034X Wafer Probe Station * Included Option D * Included Temptronics heated hot plate Location : AMERICA North (USA-Canada-Mexico)

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EG 2010 (2010) Excellent condition, high or low, cognex. Location : AMERICA North (USA-Canada-Mexico)

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Cascade 11000 Cascade 8" manual probe station. * Two positioners - Model # MH2-B * Two xyz mounts allowing po Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL IV-Hg Ellipsometer (Auto EL IV-Hg Ellipsometer) *Rudolph Auto EL-IV-Hg Multi-Wavelength Auto Location : AMERICA North (USA-Canada-Mexico)

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Rudolph FTM ellipsometer *Precise: 1nm resolution *Fast Operation: 4 seconds per measurement *Set film type, Location : AMERICA North (USA-Canada-Mexico)

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Prometrix RS-55 t/c. Tencor RS-55 t/c * 50mm - 200mm Wafers, <5mohms/sp to > Megohm/sp * Measurement Range * Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL-IV Ellipsometer * Multi-Wavelength Automatic Ellipsometer. * User can select between 3 wavel Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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