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Used Metrology and inspection equipment

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1

Fixed Binocular Head U-BI30 Pair of WHN10x/22 Eyepieces (one adjustable). Fixed Stage with Right Hand Coaxial... Location : EUROPE (Western and Northern)

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Nikon 'Optiphot 200' Microscope with video takeoff, JVC 'TK-C1381EG' Camera, sony 'PVM14N1E' monitor, spare... Location : EUROPE (Western and Northern)

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Specifications: Voltage 200V AC Hot/Cold chuck Temp: Hot chuck Gold/Nickel chuck: Nickel Hard Driver Flopp... Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)

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9

Rudolph Wafer Inspection System Attached some pictures of the system. It is a running system, fully functiona... Location : EUROPE (Western and Northern)

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Features: Automated Sheet Resistivity Meter 1 mOhm / square to 800 kOhm / square extended range up to 8x1011W/... Location : EUROPE (Western and Northern)

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Powers on, cycles through the menus Non-Contact Resistivity Monitor Refurbished Used condition Year(s) : 2011 Location : -

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Max Wafer: 150mm System Dimensions: 74x43x76 Weight: 2754 lbs - Currently Configured for 6"/150mm & 8"/200... Location : AMERICA North (USA-Canada-Mexico)

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- Dimensions: 4ft x 6ft x 3.5ft Location : AMERICA North (USA-Canada-Mexico)

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[Details of product composition posted on HP] ・ Lens: VH-Z25 (25 to 175 times) ・ Stand: VH-S10, S11 (Stage mov... Location : ASIA (North East)

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Applied voltage: 1 to 6kV ・ Discharge current: 0 to 1.5mA ・ Timer: Set number 001 to 999       Time unit 0.1s,... Location : ASIA (North East)

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Work display: 9 ~ 89mm X-ray generator: W target, tube voltage 50kV, tube current 40 ~ 1000μA X-ray detector:... Location : ASIA (North East)

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Inspection: AVI Location : ASIA (North East)

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10

Brightfield Wafer Defect Inspection System Version: 200 mm Excellent condition Still in the cleanroom, can be... Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)

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X15LP X-Ray Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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Precision XY gantry High-speed linear motors with closed-loop high-resolution linear encoders Motorized convey... Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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130 X-Ray Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Power Requirements 220/240 V 50 Hz Exterior Dimensions Width 32.677 in (83.0 cm) Depth 98.425... Year(s) : 2009 Location : EUROPE (Western and Northern)

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Condition: Refurbished system Serial No: 96CA307412 Availability: Immediate Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)

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Substrate flatness: ±2mm Board Size: 50 * 60 – 250 * 330mm PCB thickness: 0.6mm – 2.5mm weight: 30KG Product D... Location : EUROPE (Western and Northern)

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Open tube 160KV Machine was upgraded UR 7600 model tube with optional Sub-Micron resolution Machine offers ang... Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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Key features *High-powered 193nm laser *High NA 55nm pixel *Advanced thermal & vibration control *Ultra-low ab... Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

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Scatterometry Version: 300 mm Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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RTP Version: 300 mm Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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Inline AOI Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

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20-160KVa Open Tube X-Ray source Flat panel detector Rotary table w/ tilt for oblique views FXT-... Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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