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Used Metrology and inspection equipment

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1

Brightfield inspection Location : AMERICA North (USA-Canada-Mexico)

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Win-Win 50,Bright Field Inspection, 300mm Location : AMERICA North (USA-Canada-Mexico)

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Condition Good Serial Number(s) HL02112 Year(s) : 2008 Location : EUROPE (Western and Northern)

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High Energy Implanter Version: 300mm Configuration 4 FOUP (Comply with SEMI E47.1 Energy Range 10KeV to 3750Ke... Location : AMERICA North (USA-Canada-Mexico)

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1

Epi Thickness Measurement System Location : AMERICA North (USA-Canada-Mexico)

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QMC PLS-600 Pellucid Laser Scriber Orange Arrow Icon Email Item Make: QMC Model: PLS-600 Type: Scriber Year:... Year(s) : 2011 Location : South Korea

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Hands-Free 3rd Optical Inspection Station Condition Very Good Year(s) : 2017 Location : EUROPE (Western and Northern)

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is a hot gas rework station with non heated workholder Location : AMERICA North (USA-Canada-Mexico)

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TMC OPTICAL BREADBOARD VIBRATION ISOLATION TABLE. TMC’s Lab Table provides an excellent vibration- free workin... Location : AMERICA North (USA-Canada-Mexico)

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Micromex SE 160T, 300mm, Xray Inspection Location : AMERICA North (USA-Canada-Mexico)

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300mm, Film Thickness Measurement Location : AMERICA North (USA-Canada-Mexico)

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300mm, Film Thickness Measurement Location : AMERICA North (USA-Canada-Mexico)

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E-beam Inspection, 300mm Location : AMERICA North (USA-Canada-Mexico)

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ELITE M5 MC, 300mm, e-Beam Inspection Tool ID: SEI500 Location : EUROPE (Western and Northern)

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FTIR 300Watts, 3Amps, 115V 50/60Hz air & purge requirement Equipment Name: 8502861 Year(s) : 1984 Location : AMERICA North (USA-Canada-Mexico)

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Alpha Step 500 Profiler Stylus-based surface profiler adjustable between 1 and 100mg Computer controlled Scann... Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

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Therma-Wave Opti-Probe 3290 DUV Thin film measurement. Configured for 4 to 8 inch wafers Serial number 3111 So... Location : AMERICA North (USA-Canada-Mexico)

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System supports Beam Profile Reflectrometry (BPR) and Beam Profile Ellipsometry (BPE) modes BPR (Beam Profile... Location : AMERICA North (USA-Canada-Mexico)

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BioRad Microscope with (4) objectives MPlan (5,10,20,50),Hitachi KP-140 camera,top and lower light source. Location : AMERICA North (USA-Canada-Mexico)

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Therma-Wave Opti-Probe 3290 DUV Thin film measurement. Configured for 4 to 8 inch wafers Serial number 6990 So... Location : AMERICA North (USA-Canada-Mexico)

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Soluris IVS 155 Critical Dimension and optical Overlay system, Cassette to Cassette, Dual end effector, (3)... Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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KLA-Tencor 7600 Particle Inspection Station, Capable of up to 200mm wafers, for Patterned Surface Inspection S... Year(s) : 1993 Location : AMERICA North (USA-Canada-Mexico)

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Desktop Mercury Probe CV Mapper CV92A Embedded computer and a PC Up to 200 mm - 8 inch capability Drawer for r... Location : AMERICA North (USA-Canada-Mexico)

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Hitachi S8820 CD-SEM,SEM Magnification 1,000x to 150,000x,Wafer imaging ability: Entire surface of 8” wafer, D... Location : AMERICA North (USA-Canada-Mexico)

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KLA Tencor AIT UV Automated Darkfield Defect Inspection station for Pattern Wafers,More powerfull and greater... Location : AMERICA North (USA-Canada-Mexico)

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