Menu

Used Metrology and inspection equipment

987 results
1

Wafer Size:9" Equipment Details: 8". Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Transmission Electron Microscope (TEM) GATAN INC GIF 2002 CCD X-Ray detector GENESIS XM 2 Imaging 60 TEM HAADF... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
5

With MKS model LVF3527A generator and all-in-one gas boxes Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Scanning Electron Microscope (SEM) Detectors: SE, BSE, LFD (Low vac) & GSED (ESEM) OXFORD EBSD (2014) (4) Fore... Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Focused Ion Beam (FIB) system Operating system: Upgraded to Windows XP With hardware. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Transmission Electron Microscope (TEM) LaB6 Filament 404h With cryo-box Retro with TWIN lens with holder With... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Mask aligner, 2" Backside IR Lamp house: 350 W CIC1200 Power supply DVCU Box Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
0

Supertwin scanning: 200 kV Analytical imaging Diffraction CBED Low aberration Symmetrical twin lens Ion pumped... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Measurement system. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Scanning Electron Microscope (SEM). Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Particle inspection system Power supply: 208 V, 2 Phase, 60 Hz, 15.5 A Year(s) : 1993 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Dual beam Focused Ion Beam system (FIB) Without loadlock With regular stub sample holder Process: Xsection pre... Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Transmission Electron Microscope (TEM) Tungsten / LaB6 emitter EDX & GATAN Camera included Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Double sided aligner, 6"-8" UV Light: UV400 HR Lamps: MG1000W Working: 446 Hours Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Mask aligner, 2"-6" Manual wafer load mask aligner Topside alignment (TSA) ±1.0µ[email protected]σ Resolution: <1µm in vacuu... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Etcher, 8" Turbo upgraded No ESC TAC Type VAT Valves & Controllers. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Thin film stress measurement system No computer or monitor Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Scanning Electron Microscope (SEM) Operating system: Windows Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Focused ion beam (FIB) system Dual beam Includes: Main strata DB system Chiller Vacuum pump Monitor Platform... Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
0

6" Top side alignment Large gap alignment. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Focused ion beam (FIB) system Dual beam. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Mask aligner, 2"-6" Lamp house: 1000 W Lamp power supply: CIC00 / 1000 Exposure optics for UV400 Exposure time... Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Focused Ion Beam (FIB) system Prelens ion column 4-Axis stage, 50mm Secondary detector: CDEM (3) Gas injectio... Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

Mask aligner Chuck, 4" (Soft+hard+vac contact) Chuck, 6" (Edge handling, proximity only) Exposure light, Ø 6”... Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
1

FE Scanning electron microscope (FE-SEM), 8" Main unit: Fe tip: HITACHI FE Tip (Vext 4.2) (4) Barion ion pump... Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

More details  
Create an alert