Used Metrology and inspection equipment
963 results- PC Computer and Keyboard - SN: 2405 - G & H & I Line Optics - Equipped for 4", 5", 6", and 8" wafers - 1200... Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- G & H & I Line Optics - Equipped for 4", 5", 6", and 8" wafers - 1000W Lamp - Extended Focus option for thic... Year(s) : 1998 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDetails - Anly H8DA Counter/Timer - Omron H7ET Lamp Operator Location : AMERICA North (USA-Canada-Mexico)
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More detailsNE-950EX Location : ASIA (North East)
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More details8 Test Heads Test area 18.9″ x 12.2″ (480 mm x 310 mm) High-Speed Dual Shuttle System Single product set up Year(s) : 2018 Location : EUROPE (Western and Northern)
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More detailsLocation : ASIA (North East)
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More detailsSuntest CPS+ Xenon Exposure System. Control of light and temperature for aging tests. Exposure Area: 560 cm2.... Location : AMERICA North (USA-Canada-Mexico)
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More detailseDR 7100 Defect Review Vacuum tool Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel Periplan GF Magnification 10 X Field Number 18 mm Focusing YES Motorized Nosepiece YES Multip... Location : AMERICA North (USA-Canada-Mexico)
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More details*. Process: Film thickness measurement. - silicon dioxide on silicon 400~ 30,000 A. - photo resist on silicon... Year(s) : 1996 Location : ASIA (North East)
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More details*. Process: Film thickness measurement. - silicon dioxide on silicon 400~ 30,000 A. - photo resist on silicon... Year(s) : 0 Location : ASIA (North East)
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More details[ General Description ] Wafer Size : 2 ~ 6 inch Illumination Source : 25 mW laser, 405 nm wavelength Operator... Year(s) : 2006 Location : ASIA (North East)
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More detailsAligner Location : ASIA (North East)
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More detailsCompact 3, Topography & Deformation Measurement tool Tool ID: SHADM Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More details(Was an XD7500 converted to a XD7600-NT-250 sealed tube system by Dage) 160kV Max. Board Size: 508 x 444mm Max... Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsLightly Used Inline AOI Large Board: 21”x21” Max Inspection Area: 21”x21” Min Inspection Area: 2”x2” Linear Mo... Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More detailsTool ID: LOVL704 overlay inspection Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
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More detailsEDR 5200, 300mm, S/N 5040128 Tool ID: YSEM771 Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsEDR 5200, 300mm, S/N 5040135 Tool ID: YSEM772 Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDetails 3D Solder Paste Inspection 220V 1 Phase 50/60Hz Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More details[ General Description ] Wafer Size : 2 ~8 inch Illumination Source : 25 mW laser, 405 nm wavelength Operator I... Year(s) : 2009 Location : ASIA (North East)
Price : On request
More detailsDetails: Dimensions 28" x 53 1/4" x 53" Weight 288 lbs Electrical Requirements (North America): 120VAC, 10 Am... Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- Long Scan Profiler Measurement. - Standard Head with L type stylus. - Scan Length: 210mm. - Scan Speed : 1㎛... Year(s) : 0 Location : ASIA (North East)
Price : On request
More detailsHead: Micro Head 5 - sr(13, 65, 327㎛ Range) Lens Objective: Lens:6.4X , Magnification Range:300X~1012X Load Ch... Year(s) : 0 Location : ASIA (North East)
Price : On request
More details- Long Scan Profiler P-11 Measurement. - Micro Head sr with Orange stylus. - Measurement Range: 13㎛,65㎛,327㎛.... Year(s) : 1997 Location : ASIA (North East)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.