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Used Metrology and inspection equipment

673 results
1

Rudolph AutoEL IV Ellipsometer Wafer Size 6" Vintage 1985-7 *. Thin Film Thickness Measurement system. *... Year(s) : 1985 Location : ASIA (North East)

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1

Thermawave OP2600 Wafer Size 8" Vintage 1994-12 The Therma-Wave Opti-Probe 2600 and 2690 are used for mea... Year(s) : 1994 Location : ASIA (North East)

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4

Inspection Unit Quantity: 1 Location: Rambouillet, France LED Inspection station Approx. Footprint 1800 (W)... Location : France

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1

Tencor P-2 Step Height Measurement System - Wafer Size 8" - Long Scan Profiler Measurement. - Standard He... Location : ASIA (North East)

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9
Surface Mount Production Equipment

Sale Details Due to the Bankruptcy of Viapaq SAS (assembles, manufactures and supplies printed circuit boards... Location : France

Hilco Industrial
Apr, 24

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1

Tencor P-20(H) Step Height Measurement System - Wafer Size 8" - Scan Speed : 1㎛ ~ 25 mm/sec. - Stylus For... Location : ASIA (North East)

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Tencor P-20(H) Step Height Measurement Sytem - Wafer Size 8" - Scan Length: 210mm. - Scan Speed : 1㎛ ~ 25... Location : ASIA (North East)

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1

2D Inline Automated Optical Inspection PN 7299581 - FX-940 2D Inline Automated Optical Inspection (AOI) System... Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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Scanning Electron Microscope (SEM) Detectors: SE, BSE, LFD (Low vac) & GSED (ESEM) OXFORD EBSD (2014) (4) Fore... Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

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1

Mask aligner, 2" Backside IR Lamp house: 350 W CIC1200 Power supply DVCU Box Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

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1

Transmission Electron Microscope (TEM) LaB6 Filament 404h With cryo-box Retro with TWIN lens with holder With... Location : AMERICA North (USA-Canada-Mexico)

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1

Focused Ion Beam (FIB) system Operating system: Upgraded to Windows XP With hardware. Location : AMERICA North (USA-Canada-Mexico)

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1

Defect review SEM RS 4-Point probe capable, 8"-12" EDX Open cassette system. Location : AMERICA North (USA-Canada-Mexico)

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1

Scanning electron microscope (SEM) BRUKER EDS System Detector: XFlash detector 5010 Heating stage: 1000ºC CART... Location : AMERICA North (USA-Canada-Mexico)

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1

Focused ion beam (FIB) system 2004 vintage. Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)

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CD Scanning Electron Microscope (SEM) Main unit Control unit Power supply unit Wafer transfer unit (4) Anti vi... Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)

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1

RTP System, 8" RTP Mainframe Nickel plated Wide body loadlocks OTF Centre finder Chambers: A & B E & F Single... Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

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Transmission Electron Microscope (TEM) Image mode: TEM / EFTEM / STEM Acc voltage: 300 kV, FEG Schottky FEG 0.... Location : AMERICA North (USA-Canada-Mexico)

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1

FE Scanning electron microscope (FE-SEM), 8" Main unit: Fe tip: HITACHI FE Tip (Vext 4.2) (4) Barion ion pump... Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

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1

Mask aligner Chuck, 4" (Soft+hard+vac contact) Chuck, 6" (Edge handling, proximity only) Exposure light, Ø 6”... Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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Focused Ion Beam (FIB) system Prelens ion column 4-Axis stage, 50mm Secondary detector: CDEM (3) Gas injectio... Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

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1

Mask aligner, 2"-6" Lamp house: 1000 W Lamp power supply: CIC00 / 1000 Exposure optics for UV400 Exposure time... Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

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1

Focused ion beam (FIB) system Dual beam. Location : AMERICA North (USA-Canada-Mexico)

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0

6" Top side alignment Large gap alignment. Location : AMERICA North (USA-Canada-Mexico)

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1

Thin film stress measurement system No computer or monitor Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

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1

Focused ion beam (FIB) system Dual beam Includes: Main strata DB system Chiller Vacuum pump Monitor Platform... Location : AMERICA North (USA-Canada-Mexico)

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