Used Metrology and inspection equipment
967 results21″ x 24″ Test Area (Vertical Board Position) (1) Scanner Board (8) Mobile Test Heads w/Probes – (4) Front and... Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDetails: X-Ray Source: 130kV 10W Nanotech TT (Closed Tube) Test Condition: 130kV 10W Defocused Ma... Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details150mm Fully operational when powered down Video & SBC boards removed Narrow body loadlock RPC (remote plasma c... Location : ASIA (North East)
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More detailsMV-7Xi In-line AOI machine, 5 MP 5 Camera 1 top down 4 side angle cameras - 45mm topside clearance DOM: 6/10/... Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsOS: Windows 7 Pro SP1 64-bit Sw: Installed Version: 2.60R28, Installed Base Version: 8.80.14 Inspection Versio... Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSN: V30601322 2 top down cameras (1 standard top, 1 high magnification top camera for 0201) 4 Side View Camera... Location : AMERICA North (USA-Canada-Mexico)
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More detailsWindows 10 Software NYTVision Software Verions: 3.3.2 B Build 1113 5 camera (1 top / 5 side camera) Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAccessories Tip Assemblies Included P/N:AFM8175-Qty 1 P/N:AFM8153-Qty 3 Other Information Specific... Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMaximum 5240 kÅ Step Height Resolution 1.00 Å Controller Type PC Controller Type Wafer Size Range Maxim... Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDescription: Power:208VAC, 3W-N CDA: > 28.3 Nl/min, > 6.6791 kg/cm2Vac:> 28.317 l/min, > -700mm Hg Chamber Pow... Year(s) : 2006 Location : ASIA (North East)
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More detailsWafer Size 5 Location : ASIA (North East)
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More detailsWafer Size 12 Year(s) : 2002 Location : ASIA (North East)
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More detailsAleris Year(s) : 2008 Location : ASIA (North East)
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More detailsWafer Size 5 Location : ASIA (North East)
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More detailsWafer Size 12 Year(s) : 2007 Location : ASIA (North East)
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More detailsprober Dual foup VIP3 Year(s) : 2033 Location : AMERICA North (USA-Canada-Mexico)
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More detailsX-Ray system Location : ASIA (North East)
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More detailsCMP Year(s) : 2019 Location : ASIA (North East)
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More details620 Location : ASIA (North East)
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More detailsJEOL JSM 6700 Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
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More details■ Capable up to 12" Wafer ■ SSM 52 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit... Year(s) : 2008 Location : ASIA (North East)
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More details[ General Description ] Wafer Size : 2 ~ 6 inch Illumination Source : 25 mW laser, 405 nm wavelength Operator... Year(s) : 2005 Location : ASIA (North East)
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More details[ General Description ] Wafer Size : 2 ~8 inch Illumination Source : 8mW laser, 635 nm wavelength Operator Int... Year(s) : 2006 Location : ASIA (North East)
Price : On request
More details■ Capable up to 12" Wafer ■ SSM 52 Capacitance Measurement Unit ■ Auto wafer handling (Genmark robot & pre ali... Year(s) : 2004 Location : ASIA (North East)
Price : On request
More details■ Capable up to 12" Wafer ■ SSM 42 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit... Year(s) : 2001 Location : ASIA (North East)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.