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Used Metrology and inspection equipment

973 results
1

Type: Automated optical inspection machine Voltage: 100V-240V /4.4A /50-60Hz Standard Features: Pentium™ IV P... Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)

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Automated Optical Inspection Year(s) : 2016 Location : -

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2D Inline Automated Optical Inspection PN 7299581 - FX-940 2D Inline Automated Optical Inspection (AOI) System... Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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Specifications: Load locked single wafer sputter, cassette to cassette vertically mounted for sideways spu... Location : AMERICA North (USA-Canada-Mexico)

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Description: Magnetron sputtering system configured for 4" wafers, System is fully automated, cassette-to-cass... Location : AMERICA North (USA-Canada-Mexico)

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Film thickness measurement systems. Location : AMERICA North (USA-Canada-Mexico)

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Specifications: • For Etching and lithography process control • Highly stable scanning micro densitometer desi... Location : AMERICA North (USA-Canada-Mexico)

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Surfscan Specifications: 4", 6" and 8" compatible Location : AMERICA North (USA-Canada-Mexico)

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Router 4 dual heads, router software with pin less routing feet and tool radius compensation, HF 80 ( 80.000 R... Year(s) : 2015 Location : EUROPE (Western and Northern)

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– Software – Dongle Xray fluorescence spectrometer Location : AMERICA North (USA-Canada-Mexico)

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Inspection: Visual/AOI Year(s) : 2003 Location : ASIA (North East)

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Inspection/Macro/PCB Year(s) : 2002 Location : ASIA (North East)

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Inspection: Visual/AOI Year(s) : 2004 Location : ASIA (North East)

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Inspection: AOI Year(s) : 2012 Location : ASIA (North East)

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Cassette-to-Cassette Handling for 4”, 5” & 6” Wafers 100X ~ 100,000X Magnification 0.1 ~ 200 µm Measur... Year(s) : 1989 Location : AMERICA North (USA-Canada-Mexico)

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Capable of Measuring 100mm – 200mm Wafers Non-Destructive Measurement Manual Wafer Handling Epitax... Location : AMERICA North (USA-Canada-Mexico)

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Serial Number Q2128; Date of Mfg: 12/30/97 Configured for 150mm Wafers 2ea Send & Receive Cassette Ele... Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

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Serial Number Q2093 Anti-Static Load Station with Dual 8” Cassette Elevators Dual Wafer Pickup Tool wi... Location : AMERICA North (USA-Canada-Mexico)

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Magnification 10 X Zoom Range 0.7 X - 4.0 X Other Information B&L WF 10X/21 Eyepieces Zoom Range... Location : AMERICA North (USA-Canada-Mexico)

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Magnification 15 X Zoom Range 0.7 X - 3.0 X Location : AMERICA North (USA-Canada-Mexico)

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Boom (Type S) Other Information 0.7X - 3X Zoom Range B&L 10X W.F. Stereo Eyepieces Boom Stand Location : AMERICA North (USA-Canada-Mexico)

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<b>1x Bio-Rad, Q7/Q8, Overlay Metrology Tool Description</b> - Configured for 150mm Wafers - 2ea Send & R... Location : AMERICA North (USA-Canada-Mexico)

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<b>1x Neslab, HX-150DD, Recirculating Chillers, 1988 Description</b> - PN 600046 - Water Cooled Compresso... Year(s) : 1988 Location : AMERICA North (USA-Canada-Mexico)

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Brand: Towa <b>1x Towa, CC-S, Automolding System, 2000 Description</b> - Serial Number CF9001 - Lead Fra... Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)

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<b>1x ADE, Episcan 1000, Metrology Spectrometer Description</b> - Measurement of Epi Films <25µ - ON-LINE... Location : AMERICA North (USA-Canada-Mexico)

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