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Used Metrology and inspection equipment

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1

<b>1x Cascade, S300, Probers, 2004 Description</b> Configuration: up to 300mm Cascade S300 Semi-Automat... Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)

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<b>Brand: Hitachi Model: CG4000 Vintage: 2008 <u>CD Sem </b></u> <b>Specification:</b> used FAB / Metrology... Year(s) : 2008 Location : ASIA (North East)

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3

used Mitutoyo QS200Z3r Quickscope It has not been tested recently We are not sure it if works and it does not... Year(s) : 2006 Location : ASIA (North East)

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Vanguard automation platform including: - Clean room compatible stainless steel cabinetry - Dual SMIF I/O for... Year(s) : 1999 Location : EUROPE (Western and Northern)

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- LDS 3000 M/Smif, 6 and 8" capable - 1x smif Indexer INX2150 (6") and 1x smif Indexer INX2200 (8") - UV-optio... Year(s) : 2006 Location : EUROPE (Western and Northern)

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- 6” single and double orientation flat holders - Cursor and line profile measuring method - 0.1um to 10um mea... Year(s) : 1996 Location : EUROPE (Western and Northern)

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2

KLA-Tencor Surfscan 6200 (SFS6200) Wafer Surface Contamination Analysis system. The SFS6200 system in refurbi... Location : AMERICA North (USA-Canada-Mexico)

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2

KLA-Tencor Surfscan 6200 (SFS6200) Wafer Surface Contamination Analysis system. The SFS6200 system in refurbi... Location : AMERICA North (USA-Canada-Mexico)

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Includes: STEM Accessory NORAN EDX. Location : AMERICA North (USA-Canada-Mexico)

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Thin film measurement system, 6"-8" Computer: Intel Pentium III Operating system: Windows NT (2) Open cassette... Location : AMERICA North (USA-Canada-Mexico)

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Rudolph AutoEL IV Ellipsometer Wafer Size 6" Vintage 1985-7 *. Thin Film Thickness Measurement system. *... Year(s) : 1985 Location : ASIA (North East)

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1

Transmission Electron Microscope (TEM) GATAN INC GIF 2002 CCD X-Ray detector GENESIS XM 2 Imaging 60 TEM HAADF... Location : AMERICA North (USA-Canada-Mexico)

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AJA International Model # ORION8 EQUIPMENT TYPE: RF Sputter Deposition System MANUFACTURER: AJA International... Location : AMERICA North (USA-Canada-Mexico)

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1

Machine refurbished by Nordson in 2016 5 camera system, 5 megapixel Quick set-up with Auto Train Automated con... Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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5

With MKS model LVF3527A generator and all-in-one gas boxes Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

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1

Thermawave OP2600 Wafer Size 8" Vintage 1994-12 The Therma-Wave Opti-Probe 2600 and 2690 are used for mea... Year(s) : 1994 Location : ASIA (North East)

Price : On request

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4

Inspection Unit Quantity: 1 Location: Rambouillet, France LED Inspection station Approx. Footprint 1800 (W)... Location : France

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Tencor P-2 Step Height Measurement System - Wafer Size 8" - Long Scan Profiler Measurement. - Standard He... Location : ASIA (North East)

Price : On request

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Tencor P-20(H) Step Height Measurement System - Wafer Size 8" - Scan Speed : 1㎛ ~ 25 mm/sec. - Stylus For... Location : ASIA (North East)

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Tencor P-20(H) Step Height Measurement Sytem - Wafer Size 8" - Scan Length: 210mm. - Scan Speed : 1㎛ ~ 25... Location : ASIA (North East)

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2D Inline Automated Optical Inspection PN 7299581 - FX-940 2D Inline Automated Optical Inspection (AOI) System... Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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Scanning Electron Microscope (SEM) Detectors: SE, BSE, LFD (Low vac) & GSED (ESEM) OXFORD EBSD (2014) (4) Fore... Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

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Mask aligner, 2" Backside IR Lamp house: 350 W CIC1200 Power supply DVCU Box Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

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Transmission Electron Microscope (TEM) LaB6 Filament 404h With cryo-box Retro with TWIN lens with holder With... Location : AMERICA North (USA-Canada-Mexico)

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Focused Ion Beam (FIB) system Operating system: Upgraded to Windows XP With hardware. Location : AMERICA North (USA-Canada-Mexico)

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