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Used Metrology and inspection equipment

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Compacting Technologies CTI Compactor 8560 ID_140432 Location : AMERICA North (USA-Canada-Mexico)

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FIVE CAMERA 2D/3D In-Line AOI System Exclusive OMNI-VISION® 2D/3D Inspection Technology Exclusive FIFT... Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

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Fully Automated High Throughput Coating, Developing Cluster System Version: 4 INCH / 6 INCH Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

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Unpatterned Wafer Surface Inspection Tool Version: 150 mm Year(s) : 1986 Location : AMERICA North (USA-Canada-Mexico)

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Inline 3D AOI Version: SMT Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)

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Equipment crated and stored in warehouse. Resolution ≦ 38 nm NA 1.35 Reduction ratio 1:4 Maximum exposure fiel... Location : AMERICA North (USA-Canada-Mexico)

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Microscope Version: 200mm Location : AMERICA North (USA-Canada-Mexico)

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BX51RF Microscope Version: 150 mm Location : AMERICA North (USA-Canada-Mexico)

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Atomic Force Prober (AFP) Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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Failure analysis 2-D Xray system Tool ID: 20M0608AA PKG9310 Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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300, 300mm, S/N D234, FIB Tool ID: KMD2 Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)

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Programmable Surface Profiler Measuring System Version: 200 mm Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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Alpha-Step 500 Location : AMERICA North (USA-Canada-Mexico)

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hand held scanner technology Location : AMERICA North (USA-Canada-Mexico)

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Sphere Size Range:PSL Sphere diameters of 20nm to 4.0 um Substrate Sizes:100, 125, 150, 200 and 300mm wafers,... Location : AMERICA North (USA-Canada-Mexico)

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Surfscan Systems Location : AMERICA North (USA-Canada-Mexico)

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over a full, 205-mm (8.1-in.) scan. Long Scan Profilers are computerized, highly sensitive Surface Profilers t... Location : AMERICA North (USA-Canada-Mexico)

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Film Stress Measurement System Location : AMERICA North (USA-Canada-Mexico)

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Spatial Resolution 20 line-pairs/mm (standard) 100 line-pairs/mm (w/ optional 10 μm x-ray source) Ano... Location : AMERICA North (USA-Canada-Mexico)

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300mm, Orion, S/N 1501-0006-0110 Tool ID: DYD2 Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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DUVX210, 200mm, S/N 149, Surface profiler Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

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Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz Software Options: • Slope Rec... Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)

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Sloan Dektak Profilometer Location : AMERICA North (USA-Canada-Mexico)

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Inspection: AOI/2D Year(s) : 2004 Location : ASIA (North East)

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SEM/FE-SEM Location : ASIA (North East)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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