Nanometrics ECV Pro UV Electrochemical CV Profiler

Nanometrics ECVPro Carrier Concentration Profiler
For Si, SiC, II-VI, III-V & III-Nitrides
Hamamatsu LC8 UV Light Source
ECVision In-Situ Camera System
Dual Frequency Measurement
Carrier Frequency: 0.3kHz to 50kHz
Depth Range: 0.05μm to 50μm
Depth Resolution: 1nm
Dell PC, Windows 8 OS, ECV Pro SW Version 2.4.6.0

Accessories User Manual
User Guide
Flexible Exhaust Piping
Spare Parts Kit: 1ea Sealing Ring, UV Lamp, Front & Back Contact Sets, Electrolyte Filter
Tool Kit

Other Information Installation & Training Available
CE Marked YES
Condition Like New
Refurbished YES