Used Metrology and inspection equipment
1,297 resultsJOT Inspection Workstation Available Length: 60" Overhead Lighting Footrest Complete & Functional Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFein Focus Cougar XRAY System Complete 2007 160kV Microficus Demountable Open XRAY Tube With Transmission T Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details160kV Microficus Demountable Open XRAY Tube With Transmission Target (2um Resolution) Maximum Sample Size: 17" Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDefects (scar, dirt, etc.) discovered under macro illumination can be registered by means of a switch, and the Location : EUROPE (Western and Northern)
Price : On request
More detailsPCB Size supported: From L50mm x W 50mm to L460mm x W360mm Inspection time: 0.2sec / inspection area Year(s) : 2006 Location : ASIA (South East)
Price : On request
More details60A Spin/Expose/Develop Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details80 B Coat/Track 56700-3354 Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer ID Reader Optical Inspect Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsJEOL JSM 6700 Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsPlease visit our website for updated information at www.allwin21.com Updated Brochure in2024: https://allwin Year(s) : 2024 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsManufacturer: FriesResearch & Technologie GmbH The MicroProf ® is the universal surface metrology tool for q Year(s) : 2014 Location : EUROPE (Western and Northern)
Price : On request
More details• Measurement method: Tunable diode laser absorption spectroscopy • Application: Permeation measurement • Suit Year(s) : 2014 Location : EUROPE (Western and Northern)
Price : On request
More details• Application: Professional micromachining • Intended use: Research and development • Laser type compatibility Year(s) : 2015 Location : EUROPE (Western and Northern)
Price : On request
More detailsManufacturer: F&S BONDTEC Semiconductor GmbH Semi-automatic gold-ball wirebonder with pull & shear heads. Sp Year(s) : 2005 Location : EUROPE (Western and Northern)
Price : On request
More details- Touchscreen operator interface for basic operation - PC-based software for recipe creation and editing - Year(s) : 2019 Location : EUROPE (Western and Northern)
Price : On request
More details- Alignment System MA150e TSA - PC -Aut. Adjustment ( Autoalignment System) Cognex 8100 ( Patmex ) TSA - Lamph Location : EUROPE (Western and Northern)
Price : On request
More detailsDescription: Inspection microscopes microscopes microscopes microscopes Longdescription: Inspection microsc Location : EUROPE (Western and Northern)
Price : On request
More detailsdescription: - the laser is alive it is built for 110V, but we have a generator Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsstepper Location : ASIA (North East)
Price : On request
More detailsMask aligner up to 6inch wafer Year(s) : 2009 Location : ASIA (North East)
Price : On request
More detailsWafer Size 4 Year(s) : 2012 Location : ASIA (North East)
Price : On request
More detailsWafer Size 8 Year(s) : 1996 Location : ASIA (North East)
Price : On request
More detailsWafer Size 12 Year(s) : 2006 Location : ASIA (North East)
Price : On request
More detailsDescription Step Height Measure Location : ASIA (North East)
Price : On request
More detailsThickness Measurement Wafer Size 8" Location : ASIA (North East)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.