Used Metrology and inspection equipment
1,314 resultsspin dryer with 150mm wafer carrier Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMaximum 6" wafers Includes rotor for 6"x6" substrates Static eliminators Resistivity monitor PSC-101 controlle Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDimension 3100 AFM X-Y imaging area approx. 90um square Z range approx. 6um up to 150mm sample size nanoscope Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMitutoyo microscope 1064nm pulsed YAG laser Alessi 4100 manual prober with 150mm vacuum chuck Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDMP-3000 fluid deposition printer with 300mm x 300mm print area and positional accuracy of 5um Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details150mm wafer chuck probe card holder joystick controller XY linear motor drive for chuck manual XY microscope t Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWyko Veeco NT 8000Â 8 x 8 stage with Galil 5 axis stage controller Nixsystem G5 computer , running windows 7Â Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsInternational 200mm hot chuck with digital controller Location : AMERICA North (USA-Canada-Mexico)
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More detailsOperating Temperature: 70 K to 730 K Temperature Stability: ± 0.1 K with MMR's Programmable Controller Temper Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsPH150 micropositioner with vacuum hold-down - Condition Refurbished Location : AMERICA North (USA-Canada-Mexico)
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More detailsMeas. technique: non-contact, junction photovoltage (JPV) Sample size: 100 to 156 mm (210mm option) Sa Location : AMERICA North (USA-Canada-Mexico)
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More detailsmicropositioner with vacuum base 12C Picoprobe with power supply Location : AMERICA North (USA-Canada-Mexico)
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More detailsVeeco/Digital Instruments Nanoscope III SPM Atomic Force Microscope Nanoscope III SPM and controller, LSSF la Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsVeeco CPII Atomic Force Microscope Motorized Z stage, scans up to 100um, Mitutoyo M Plan Apo 20SL objective w Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSuss/MFI Vibsense For use with Suss MFI Probehead or for the monitoring of environmental parameters of any pi Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsRMS Systems/Hologenix NGS 3500 Defect Detection System Automatic Defect Detection & Classification Automated Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsApplication: Pre-reflow SPI to catch print defects before they reach the oven Machine Type : Advanced 3D Inspe Year(s) : 2022 Location : EUROPE (Western and Northern)
Price : On request
More detailsHigh-Performance 3D Solder Paste Inspection System with KSMART SPC Integration The Koh Young KY8030-3(HS) is Year(s) : 2021 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKOH YOUNG KY-8030-3 Year:2021 Good running condition Year(s) : 2021 Location : EUROPE (Western and Northern)
Price : On request
More detailsComplete S-3200N SEM with Oxford INCAx-act Detector Oxford INCAx-act Detector Vintage 2009 Res:5.9KeV 129eV Year(s) : 1996 Location : EUROPE (Western and Northern)
Price : On request
More detailsShadow Proof 3D Sensor 1D/2D Internal Reader Sigmalink Offline Review Software Vision 3D Program Inspection So Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFlying probe tester (FPT) with 16 probes, 8 bottom - 8 top side, alignment system w/ CCD B/W cameras (both s Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsMalvern Panalytical Omega / Theta XRD X-ray Diffraction System, 6" - 200-240 Vac - 50/60 Hz 2022 Vintage Year(s) : 2022 Location : EUROPE (Western and Northern)
Price : On request
More detailsHitachi Scanning Electron Microscope S-3400N Secondary Electron Image Resolution: 3.0nm (High Vacuum Mode), Location : ASIA (North East)
Price : On request
More detailsViscom S3088‐III AOI Inspection System Power: 2.5 kw 50-60 Hz High‐performance inline AOI system designed for Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.