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Used Metrology and inspection equipment

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2

Manufacture: <b>Alessi</b> Model#: <b>REL-4500</b> <b>Description:</b> Analytical Wafer Prober Semi-Auto... Location : AMERICA North (USA-Canada-Mexico)

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Manufacturer Nikon Model Optiphot 200 Wafer Inspection Microscope Location : AMERICA North (USA-Canada-Mexico)

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<b>1x Rigaku, 3640, Xray Fluorescence Spectrometer Description</b> Minimum 100 mm Maximum 200 mm Set S... Location : AMERICA North (USA-Canada-Mexico)

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<b>1x BioRad, QS-408M, FT-IR Spectrometers Description</b> - Capable of Measuring 100mm – 200mm Wafers -... Location : AMERICA North (USA-Canada-Mexico)

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<b>1x Materials Dev Corp, CSM/16, Automatic CV Plotter with RM-1600 Computer Description</b> - Serial Numb... Location : AMERICA North (USA-Canada-Mexico)

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<b>1x SDI Diagnostics Inc, FAaST 330, Metrology Equipment Description</b> - COCOS, SILC & EPI-t Test Capab... Location : AMERICA North (USA-Canada-Mexico)

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<b>1x KLA-Tencor, AlphaStep 300, Profilometer Description</b> - Serial Number 0492-0139 Date of Mfg: 4/92... Location : AMERICA North (USA-Canada-Mexico)

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Type: Automated optical inspection machine Voltage: 100V-240V /4.4A /50-60Hz Standard Features: Pentium™ IV P... Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)

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Automated Optical Inspection Year(s) : 2016 Location : -

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2D Inline Automated Optical Inspection PN 7299581 - FX-940 2D Inline Automated Optical Inspection (AOI) System... Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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Specifications: Load locked single wafer sputter, cassette to cassette vertically mounted for sideways spu... Location : AMERICA North (USA-Canada-Mexico)

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Description: Magnetron sputtering system configured for 4" wafers, System is fully automated, cassette-to-cass... Location : AMERICA North (USA-Canada-Mexico)

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Film thickness measurement systems. Location : AMERICA North (USA-Canada-Mexico)

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Specifications: • For Etching and lithography process control • Highly stable scanning micro densitometer desi... Location : AMERICA North (USA-Canada-Mexico)

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Surfscan Specifications: 4", 6" and 8" compatible Location : AMERICA North (USA-Canada-Mexico)

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Router 4 dual heads, router software with pin less routing feet and tool radius compensation, HF 80 ( 80.000 R... Year(s) : 2015 Location : EUROPE (Western and Northern)

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– Software – Dongle Xray fluorescence spectrometer Location : AMERICA North (USA-Canada-Mexico)

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Inspection: Visual/AOI Year(s) : 2003 Location : ASIA (North East)

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Inspection/Macro/PCB Year(s) : 2002 Location : ASIA (North East)

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Inspection: Visual/AOI Year(s) : 2004 Location : ASIA (North East)

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Inspection: AOI Year(s) : 2012 Location : ASIA (North East)

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Cassette-to-Cassette Handling for 4”, 5” & 6” Wafers 100X ~ 100,000X Magnification 0.1 ~ 200 µm Measur... Year(s) : 1989 Location : AMERICA North (USA-Canada-Mexico)

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Capable of Measuring 100mm – 200mm Wafers Non-Destructive Measurement Manual Wafer Handling Epitax... Location : AMERICA North (USA-Canada-Mexico)

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Serial Number Q2128; Date of Mfg: 12/30/97 Configured for 150mm Wafers 2ea Send & Receive Cassette Ele... Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

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Serial Number Q2093 Anti-Static Load Station with Dual 8” Cassette Elevators Dual Wafer Pickup Tool wi... Location : AMERICA North (USA-Canada-Mexico)

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