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Used Metrology and inspection equipment

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Dark field defect detection tool, setup for 200mm or 300mm wafers, 2 Cameras 200 and 300mm compatible with dua Location : AMERICA North (USA-Canada-Mexico)

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3D measuring platform for products of max 600mm x 600mm x 300mm lxwxh, resolution 0,0001mm. Year 2008. Year(s) : 2008 Location : EUROPE (Western and Northern)

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Manufactured in 1999, this MicroXcel PFX CMM is a clean machine in good working condition. It includes a comp Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

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Pre-owned Xcel 7107 CMM that was built in 1995 and has been kept in a lab environment. This machine comes wi Location : AMERICA North (USA-Canada-Mexico)

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This Shop Floor Tigo CMM was built in 2017 and is in good working condition. It comes with a computer, monito Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)

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• Program Capacity: Unlimited user-defined steps per recipe • Step Time Resolution: 0.1 second • Maximum Step Location : AMERICA North (USA-Canada-Mexico)

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Reflected light optical microscope with 4 objectives, Plan 4x, 10x, 40x, 100x and 10X eyepieces. 2.5” x 2.5” s Location : AMERICA North (USA-Canada-Mexico)

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Measurement Display Range … 200 A to 655,000 A (20nm to 65,000nm) Vertical Resolution … 5A (.5nm) Scan Length Location : AMERICA North (USA-Canada-Mexico)

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- 6" Nikon Stage with 6", 5", 4" pockets - 360 degree stage rotation - Auto Turret with 5x, 10x, 20x, 50x, 100 Location : AMERICA North (USA-Canada-Mexico)

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- SN: 131001B - Windows 7 PC Location : AMERICA North (USA-Canada-Mexico)

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Substrate Size 6" Wafer Size 150 mm Wafer Size Range Maximum 150 mm Controller Type Microprocessor Controller Location : AMERICA North (USA-Canada-Mexico)

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Olympus BX60 Microscope consisting of: - Model: BX60F5 - 4" Wafer Stage - Bright Field & Dark Field - Turret Location : AMERICA North (USA-Canada-Mexico)

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Nikon LV150 Microscope consisting of: - Model: LV150 - 6" Nikon Stage with 6", 5", 4" pockets - 360 degree st Location : AMERICA North (USA-Canada-Mexico)

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Nikon NEXIV VMR-3020 CNC Video Measuring System The Nikon NEXIV VMR-3020 is a high-precision, automated 3D no Location : AMERICA North (USA-Canada-Mexico)

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• Binocular Angle: Ergonomic • Eyepiece Model: C-W 10xB/22 • Eyepiece Magnification: 10 X • Field Number: 22 m Location : AMERICA North (USA-Canada-Mexico)

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Insertion Machine Model MultiSert Location : AMERICA North (USA-Canada-Mexico)

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X-Ray System Model YTX-3000 Location : AMERICA North (USA-Canada-Mexico)

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X-ray Inspection System Model FXS 100.24 Microfocus Location : AMERICA North (USA-Canada-Mexico)

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Make: Creative Electron TruView™ Novus The TruView™ Novus is a 2D, 2.5D, and 3D offline X-ray inspection syste Location : AMERICA North (USA-Canada-Mexico)

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INLINE AOI SYSTEM MODEL VT S500-02 Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)

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Automated Optical Inspection System Brand Pemtron Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)

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YTV-FX 2D AOI Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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CR TECH CRX-1000 X-Ray System Location : AMERICA North (USA-Canada-Mexico)

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GE Phoenix Nanomex PCBA Analyser 160 X-Ray System Location : AMERICA North (USA-Canada-Mexico)

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X-Ray System Model Nanomex 160 Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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