Used Metrology and inspection equipment
1,258 resultsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model Shelby LD10 Vin Year(s) : 2014 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier COMPLAIN Model Spectra Fi Year(s) : 2015 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier COMPLAIN Model Spectra Fi Year(s) : 2015 Location : United States (USA)
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More detailsWafer Size 200 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model OP5240I Vintage Year(s) : 1999 Location : United States (USA)
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More detailsAsset Description Focus Ion Beam Mill Software Version Windows Process Focus Ion Beam Mill Hardware Confgurat Year(s) : 2015 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Lab General Product Information Vendor Supplier FEI Model FEI ExSolve CLM next Year(s) : 2015 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier KLA Model 2835 Bri Year(s) : 2012 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Failure Analysis Tool Available Date 2024-08-27 General Product Information Vin Year(s) : 2011 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier AMAT Model UVision Year(s) : 2014 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Lab General Product Information Vendor Supplier FEI Model FEI ExSolve CLM Next Year(s) : 2016 Location : United States (USA)
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More detailsFab Section Failure Analysis General Product Information Vendor Supplier BRUKER Model D8 Davinci Vintage 2013 Year(s) : 2013 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier AMAT Model UVISION Year(s) : 2013 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model Archer A500 AIM Year(s) : 2014 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA-TENCOR Model EDR 5210 Year(s) : 2010 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier BRUKER Model D8 Fabline V Year(s) : 2014 Location : United States (USA)
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More detailsOP2600DUVI, 200mm, s/n: 6454 Year(s) : 1997 Location : United States (USA)
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More detailsOP3260I, 200mm, s/n: 6678 Year(s) : 1998 Location : United States (USA)
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More detailsScanning Electron Microscopes Year(s) : 2008 Location : United States (USA)
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More detailsEDR 5210, 300mm, s/n: 5040135 Year(s) : 2010 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier AMAT Model Verity1 SEM Vi Year(s) : 2005 Location : United States (USA)
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More detailsRaider ECD310 Year(s) : 2006 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier HSEB (now Unity SC) Model Year(s) : 2007 Location : United States (USA)
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More detailsTool Status Disconnected Wafer Size 300 mm Fab Section Support Tools General Product Information Vendor Suppl Year(s) : 2009 Location : United States (USA)
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More detailsWafer Size 300 mm Fab Section Thin Film Asset Description THK2550-T - THK2550FP RUDOLPH S3000S (MT) Software Year(s) : 2011 Location : United States (USA)
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More detailsWafer Size 200 mm Fab Section Metrology General Product Information Vendor Supplier KLA Tencor Model AIT II V Year(s) : 2000 Location : United States (USA)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.