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Nanometrics Nanospec AFT2100 Film Thickness Measurement System
Ref :
2774622-9-CP
Condition :
Used
Manufacturer :
Nanometrics
Model :
Nanospec AFT2100 Film Thickness Measurement System
Year(s) :
-
Quantity :
1
Location :
Seller or machines location:
EUROPE (Western and Northern)
EUROPE (Western and Northern)
film thickness from 100A to 50 microns
Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objectives
including new vertical illuminator
spot size 6.5um to 65um
wavelength range 400-800nm
16 standard films tests
special films can be measured by entering the refractive index
Refurbished by Nanometrics factory trained technicians March 2019
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