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Semiconductor Diagnostics SDI 210 210E-SPV, FAaST, Wafer Measurement
Ref :
2761620-9-CP
Condition :
Used
Manufacturer :
Semiconductor Diagnostics
Model :
SDI 210 210E-SPV, FAaST, Wafer Measurement
Year(s) :
1993
Quantity :
1
Location :
Seller or machines location:
EUROPE (Western and Northern)
EUROPE (Western and Northern)
Used, looks complete, very clean
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